01659oam 2200409zu 450 991087261940332120241212214838.0(CKB)111026746717166(SSID)ssj0000454955(PQKBManifestationID)12150203(PQKBTitleCode)TC0000454955(PQKBWorkID)10397910(PQKB)11724667(NjHacI)99111026746717166(EXLCZ)9911102674671716620160829d1997 uy engur|||||||||||txtccr1997 IEEE International Reliability Physics Symposium[Place of publication not identified]IEEE19971 online resource (540 pages)Bibliographic Level Mode of Issuance: Monograph9780780335752 0780335759 These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.Electronic apparatus and appliancesReliabilityCongressesElectronic apparatus and appliancesReliability621.381IEEE, Institute of Electrical and Electronics Engineers, Inc. StaffPQKBBOOK99108726194033211997 IEEE International Reliability Physics Symposium2512805UNINA