A Practical Guide to Surface Metrology / Michael Quinten

• Autore: Quinten, Michael
• Pubblicazione: Cham, : Springer, 2019
• Titolo uniforme: A Practical Guide to Surface Metrology
• Descrizione fisica: xxv, 230 p. : ill. ; 24 cm
• Soggetto topico: 00A79 (77-XX) - Physics [MSC 2020]; 78A60 - Lasers, masers, optical bistability, nonlinear optics [MSC 2020]; 74K35 - Thin films [MSC 2020]; 74A50 - Structured surfaces and interfaces, coexistent phases [MSC 2020]
• Soggetto non controllato: Confocal optical profiling; Digital Holographic Microscopy; Elastic light scattering; Grazing incidence interferometry; Light sectional methods; Multi-wavelength interferometry; Practical surface characterisation; Practical surface measurement; Scanning nearfield optical microscopy; Shearing interferometry; Spectral Reflectometry and Ellipsometry; Surface optical metrology; White light interferometry
• Titolo autorizzato: Practical Guide to Surface Metrology
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: VAN0214455
• Lo trovi qui: Univ. Vanvitelli
• Localizzazioni e accesso elettronico: http://doi.org/10.1007/978-3-030-29454-0
• Serie: Springer Series in Measurement Science and Technology Berlin [etc.] . -Springer