02320nam0 22005053i 450 VAN021445520230606100252.842N978303029454020210920d2019 |0itac50 baengCH|||| |||||ˆA ‰Practical Guide to Surface MetrologyMichael QuintenChamSpringer2019xxv, 230 p.ill.24 cm001VAN01248482001 Springer Series in Measurement Science and Technology210 Berlin [etc.]SpringerVAN0214456ˆA ‰Practical Guide to Surface Metrology259809800A79 (77-XX)Physics [MSC 2020]VANC023182MF78A60Lasers, masers, optical bistability, nonlinear optics [MSC 2020]VANC029030MF74K35Thin films [MSC 2020]VANC033952MF74A50Structured surfaces and interfaces, coexistent phases [MSC 2020]VANC036162MFConfocal optical profilingKW:KDigital Holographic MicroscopyKW:KElastic light scatteringKW:KGrazing incidence interferometryKW:KLight sectional methodsKW:KMulti-wavelength interferometryKW:KPractical surface characterisationKW:KPractical surface measurementKW:KScanning nearfield optical microscopyKW:KShearing interferometryKW:KSpectral Reflectometry and EllipsometryKW:KSurface optical metrologyKW:KWhite light interferometryKW:KCHChamVANL001889QuintenMichaelVANV18383321849Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-030-29454-0E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0214455BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 3824 08eMF3824 20210920 Practical Guide to Surface Metrology2598098UNICAMPANIA