00951nam a2200265 i 450099100194051970753620020503155143.0010104s1957 it ||| | ita b10294132-39ule_instEXGIL93996ExLBiblioteca Interfacoltàita841.8Ruff, Marcel A.132149Baudelaire /Marcel A. RuffParis :Hatier,1957121 p.Connaissance des lettres ;41Baudelaire, Charles.b1029413217-02-1727-06-02991001940519707536LE002 Fr. III N 812002000953988le002-E0.00-l- 00000.i1034729x27-06-02LE002 Fondo Giudici H 73622002000303967le002-E0.00-no 00000.i1513740527-05-10Baudelaire208954UNISALENTOle00201-01-01ma -itait 0101102nam a2200241 a 4500991001411559707536111003s1907it 000 0 ita db14010343-39ule_instDip.to Studi Giuridiciita344.032Legge riguardante disposizioni sui manicomi e sugli alienati : 14 febbraio 1904, n. 36 corredata del testo completo .... [etc.] Napoli :E. Pietrocola, successore A. Molina,1907239 p. :17 cm.Biblioteca legale ;568Ospedali psichiatriciLegislazione1907AlienatiAssistenza socialeLegislazione1907Italia <Regno>Leggi, statuti etc..b1401034303-10-1103-10-11991001411559707536LE027 F/A II U LEGGI 40/041le027pE5.00-n- 00000.i1532629903-10-11Legge riguardante disposizioni sui manicomi e sugli alienati : 14 febbraio 1904, n. 36 corredata del testo completo ....241991UNISALENTOle02703-10-11ma -itait 0002320nam0 22005053i 450 VAN021445520230606100252.842N978303029454020210920d2019 |0itac50 baengCH|||| |||||ˆA ‰Practical Guide to Surface MetrologyMichael QuintenChamSpringer2019xxv, 230 p.ill.24 cm001VAN01248482001 Springer Series in Measurement Science and Technology210 Berlin [etc.]SpringerVAN0214456ˆA ‰Practical Guide to Surface Metrology259809800A79 (77-XX)Physics [MSC 2020]VANC023182MF78A60Lasers, masers, optical bistability, nonlinear optics [MSC 2020]VANC029030MF74K35Thin films [MSC 2020]VANC033952MF74A50Structured surfaces and interfaces, coexistent phases [MSC 2020]VANC036162MFConfocal optical profilingKW:KDigital Holographic MicroscopyKW:KElastic light scatteringKW:KGrazing incidence interferometryKW:KLight sectional methodsKW:KMulti-wavelength interferometryKW:KPractical surface characterisationKW:KPractical surface measurementKW:KScanning nearfield optical microscopyKW:KShearing interferometryKW:KSpectral Reflectometry and EllipsometryKW:KSurface optical metrologyKW:KWhite light interferometryKW:KCHChamVANL001889QuintenMichaelVANV18383321849Springer <editore>VANV108073650ITSOL20240614RICAhttp://doi.org/10.1007/978-3-030-29454-0E-book – Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o ShibbolethBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICAIT-CE0120VAN08NVAN0214455BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08CONS e-book 3824 08eMF3824 20210920 Practical Guide to Surface Metrology2598098UNICAMPANIA