LEADER 02320nam0 22005053i 450 001 VAN0214455 005 20230606100252.842 017 70$2N$a9783030294540 100 $a20210920d2019 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $aˆA ‰Practical Guide to Surface Metrology$fMichael Quinten 210 $aCham$cSpringer$d2019 215 $axxv, 230 p.$cill.$d24 cm 410 1$1001VAN0124848$12001 $aSpringer Series in Measurement Science and Technology$1210 $aBerlin [etc.]$cSpringer 500 1$3VAN0214456$aˆA ‰Practical Guide to Surface Metrology$92598098 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a78A60$xLasers, masers, optical bistability, nonlinear optics [MSC 2020]$3VANC029030$2MF 606 $a74K35$xThin films [MSC 2020]$3VANC033952$2MF 606 $a74A50$xStructured surfaces and interfaces, coexistent phases [MSC 2020]$3VANC036162$2MF 610 $aConfocal optical profiling$9KW:K 610 $aDigital Holographic Microscopy$9KW:K 610 $aElastic light scattering$9KW:K 610 $aGrazing incidence interferometry$9KW:K 610 $aLight sectional methods$9KW:K 610 $aMulti-wavelength interferometry$9KW:K 610 $aPractical surface characterisation$9KW:K 610 $aPractical surface measurement$9KW:K 610 $aScanning nearfield optical microscopy$9KW:K 610 $aShearing interferometry$9KW:K 610 $aSpectral Reflectometry and Ellipsometry$9KW:K 610 $aSurface optical metrology$9KW:K 610 $aWhite light interferometry$9KW:K 620 $aCH$dCham$3VANL001889 700 1$aQuinten$bMichael$3VANV183833$021849 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttp://doi.org/10.1007/978-3-030-29454-0$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN0214455 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08CONS e-book 3824 $e08eMF3824 20210920 996 $aPractical Guide to Surface Metrology$92598098 997 $aUNICAMPANIA