Contact Mechanics and Friction [[electronic resource] ] : Physical Principles and Applications / / by Valentin L. Popov |
Autore | Popov Valentin L |
Edizione | [2nd ed. 2017.] |
Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2017 |
Descrizione fisica | 1 online resource (XVII, 391 p. 260 illus., 35 illus. in color.) |
Disciplina | 620.1 |
Soggetto topico |
Mechanics
Mechanics, Applied Tribology Corrosion and anti-corrosives Coatings Mechanical engineering Solid state physics Solid Mechanics Tribology, Corrosion and Coatings Mechanical Engineering Solid State Physics |
ISBN | 9783662530818 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Qualitative Treatment of Contact Problems – Normal Contact without Adhesion -- Qualitative Treatment of Adhesive Contacts -- Capillary Forces -- Rigorous Treatment of Contact Problems – Hertzian Contact -- Rigorous Treatment of Contact Problems – Adhesive Contact -- Contact between Rough Surfaces -- Tangential Contact Problems -- Rolling Contact -- Coulomb’s Law of Friction -- The Prandtl-Tomlinson Model for Dry Friction -- Frictionally Induced Vibrations -- Thermal Effects in Contacts -- Lubricated Systems -- Viscoelastic Properties of Elastomers -- Rubber Friction and Contact Mechanics of Rubber -- Wear -- Friction Under the Influence of Ultrasonic Vibrations -- Numerical Simulation Methods in Friction Physics -- Earthquakes and Friction -- Appendix -- Further Reading -- Figure Reference -- Index. |
Record Nr. | UNINA-9910254326803321 |
Popov Valentin L | ||
Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2017 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Cooling Electrons in Nanoelectronic Devices by On-Chip Demagnetisation [[electronic resource] /] / by Alexander Thomas Jones |
Autore | Jones Alexander Thomas |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
Descrizione fisica | 1 online resource (XIII, 94 p. 45 illus.) |
Disciplina | 536.56 |
Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
Soggetto topico |
Low temperature physics
Low temperatures Materials science Solid state physics Low Temperature Physics Materials Science, general Solid State Physics |
ISBN | 3-030-51233-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Background -- On-Chip Demagnetisation Cooling on a Cryogen-Free Dilution Refrigerator -- On-Chip Demagnetisation Cooling on a Cryogen-Filled Dilution Refrigerator -- On-Chip Demagnetisation Cooling of a High Capacitance CBT -- Summary and Outlook. |
Record Nr. | UNINA-9910412155203321 |
Jones Alexander Thomas | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Cooling Electrons in Nanoelectronic Devices by On-Chip Demagnetisation [[electronic resource] /] / by Alexander Thomas Jones |
Autore | Jones Alexander Thomas |
Edizione | [1st ed. 2020.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 |
Descrizione fisica | 1 online resource (XIII, 94 p. 45 illus.) |
Disciplina | 536.56 |
Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
Soggetto topico |
Low temperature physics
Low temperatures Materials science Solid state physics Low Temperature Physics Materials Science, general Solid State Physics |
ISBN | 3-030-51233-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Background -- On-Chip Demagnetisation Cooling on a Cryogen-Free Dilution Refrigerator -- On-Chip Demagnetisation Cooling on a Cryogen-Filled Dilution Refrigerator -- On-Chip Demagnetisation Cooling of a High Capacitance CBT -- Summary and Outlook. |
Record Nr. | UNISA-996418176303316 |
Jones Alexander Thomas | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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Debye Screening Length [[electronic resource] ] : Effects of Nanostructured Materials / / by Kamakhya Prasad Ghatak, Sitangshu Bhattacharya |
Autore | Ghatak Kamakhya Prasad |
Edizione | [1st ed. 2014.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 |
Descrizione fisica | 1 online resource (XXXIII, 385 p. 123 illus.) |
Disciplina | 621.381520287 |
Collana | Springer Tracts in Modern Physics |
Soggetto topico |
Semiconductors
Optical materials Electronic materials Solid state physics Nanotechnology Nanoscale science Nanoscience Nanostructures Optical and Electronic Materials Solid State Physics Nanoscale Science and Technology |
ISBN | 3-319-01339-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | From the Contents: Part I Influence of Light Waves on the DSL in Optoelectronic Semiconductors -- Part II Influence of Quantum Confinement on the DSL in Non-Parabolic Semiconductors -- Part III Influence of Intense Electric Field on the DSL in Optoelectronic Semiconductors. |
Record Nr. | UNINA-9910300376103321 |
Ghatak Kamakhya Prasad | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Defects and Impurities in Silicon Materials [[electronic resource] ] : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche |
Edizione | [1st ed. 2015.] |
Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (XV, 487 p. 292 illus., 180 illus. in color.) |
Disciplina | 546.683 |
Collana | Lecture Notes in Physics |
Soggetto topico |
Semiconductors
Nanotechnology Engineering—Materials Solid state physics Nanoscale science Nanoscience Nanostructures Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology |
ISBN | 4-431-55800-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Diffusion and point defects in silicon materials -- Density functional modeling of defects and impurities in silicon materials -- Electrical and optical defect evaluation techniques for electronic and solar grade silicon -- Intrinsic point defect engineering during single crystal Si and Ge growth from a melt -- Computer simulation of crystal growth for CZ-Si single crystals and Si solar cells -- Oxygen precipitation in silicon -- Defect characterization by electron beam induced current and cathode luminescence methods -- Nuclear methods to study defects and impurities in Si materials using heavy ion accelerators -- Defect Engineering in silicon materials. |
Record Nr. | UNINA-9910136808703321 |
Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Defects and Impurities in Silicon Materials [[electronic resource] ] : An Introduction to Atomic-Level Silicon Engineering / / edited by Yutaka Yoshida, Guido Langouche |
Edizione | [1st ed. 2015.] |
Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 |
Descrizione fisica | 1 online resource (XV, 487 p. 292 illus., 180 illus. in color.) |
Disciplina | 546.683 |
Collana | Lecture Notes in Physics |
Soggetto topico |
Semiconductors
Nanotechnology Engineering—Materials Solid state physics Nanoscale science Nanoscience Nanostructures Materials Engineering Nanotechnology and Microengineering Solid State Physics Nanoscale Science and Technology |
ISBN | 4-431-55800-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Diffusion and point defects in silicon materials -- Density functional modeling of defects and impurities in silicon materials -- Electrical and optical defect evaluation techniques for electronic and solar grade silicon -- Intrinsic point defect engineering during single crystal Si and Ge growth from a melt -- Computer simulation of crystal growth for CZ-Si single crystals and Si solar cells -- Oxygen precipitation in silicon -- Defect characterization by electron beam induced current and cathode luminescence methods -- Nuclear methods to study defects and impurities in Si materials using heavy ion accelerators -- Defect Engineering in silicon materials. |
Record Nr. | UNISA-996466796403316 |
Tokyo : , : Springer Japan : , : Imprint : Springer, , 2015 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
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Density Functional Theory in Quantum Chemistry [[electronic resource] /] / by Takao Tsuneda |
Autore | Tsuneda Takao |
Edizione | [1st ed. 2014.] |
Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2014 |
Descrizione fisica | 1 online resource (207 p.) |
Disciplina | 541.28 |
Soggetto topico |
Chemistry, Physical and theoretical
Mathematical physics Solid state physics Theoretical and Computational Chemistry Theoretical, Mathematical and Computational Physics Solid State Physics |
ISBN | 4-431-54825-4 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Quantum Chemistry -- Hartree-Fock method -- Electron correlation -- Kohn-Sham method -- Exchange-correlation functionals -- Corrections for functionals -- Orbital energy -- Appendix: Fundamental Conditions. |
Record Nr. | UNINA-9910298642103321 |
Tsuneda Takao | ||
Tokyo : , : Springer Japan : , : Imprint : Springer, , 2014 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Diffusion in Ceramics [[electronic resource] /] / by Joshua Pelleg |
Autore | Pelleg Joshua |
Edizione | [1st ed. 2016.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
Descrizione fisica | 1 online resource (XXII, 448 p. 365 illus., 50 illus. in color.) |
Disciplina | 530.415 |
Collana | Solid Mechanics and Its Applications |
Soggetto topico |
Materials science
Mechanics Mechanics, Applied Solid state physics Characterization and Evaluation of Materials Solid Mechanics Solid State Physics |
ISBN | 3-319-18437-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Part A Fundamentals of Diffusion -- 1 Macroscopic Diffusion -- 2 Microscopic (or Atomic) Diffusion -- 3 Defects in Materials -- 4 Mechanism of Diffusion -- 5 Self Diffusion, Solute Diffusion, Diffusion in Ionic Crystals and Correlation Effects -- 6 Interdiffusion -- 7 Diffusion in Grain Boundaries -- 8 Diffusion in Dislocations -- 9 Experimental Methods and Procedures -- 10 Empirical Rules -- Part B Diffusion in Ceramics (Experimental) -- 11 Diffusion in Alumina Single Crystals -- 12 Diffusion in Silicon Carbide (Carborundum) -- 13 Diffusion in MgO (Magnesia or Periclase) -- 14 Diffusion in ZrO2 (Zirconia) Single Crystals -- 15 Diffusion in Si3N4 Single Crystals -- Index. |
Record Nr. | UNINA-9910254213703321 |
Pelleg Joshua | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Dispersion Relations in Heavily-Doped Nanostructures [[electronic resource] /] / by Kamakhya Prasad Ghatak |
Autore | Ghatak Kamakhya Prasad |
Edizione | [1st ed. 2016.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 |
Descrizione fisica | 1 online resource (LV, 625 p. 31 illus.) |
Disciplina | 537.622 |
Collana | Springer Tracts in Modern Physics |
Soggetto topico |
Semiconductors
Nanotechnology Microwaves Optical engineering Nanoscale science Nanoscience Nanostructures Solid state physics Microwaves, RF and Optical Engineering Nanoscale Science and Technology Solid State Physics |
ISBN | 3-319-21000-9 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | From the Contents: The DR in Quantum Wells (QWs) of Heavily Doped(HD) Non-Parabolic Semiconductors -- The DR in Nano-Wires (NWs) of Heavily Doped (HD) Non-Parabolic Semiconductors -- The DR in Quantum Box (QB) of Heavily Doped (HD) Non-Parabolic Semiconductors -- The DR in doping superlattices of HD Non-Parabolic Semiconductors -- The DR in Accumulation and Inversion Layers of Non-Parabolic Semiconductors. |
Record Nr. | UNINA-9910254605303321 |
Ghatak Kamakhya Prasad | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2016 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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Dynamic Spin-Fluctuation Theory of Metallic Magnetism [[electronic resource] /] / by Nikolai B. Melnikov, Boris I. Reser |
Autore | Melnikov Nikolai B |
Edizione | [1st ed. 2018.] |
Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
Descrizione fisica | 1 online resource (XVIII, 287 p. 59 illus., 18 illus. in color.) |
Disciplina | 538 |
Soggetto topico |
Magnetism
Magnetic materials Metals Electrochemistry Quantum computers Spintronics Solid state physics Magnetism, Magnetic Materials Metallic Materials Quantum Information Technology, Spintronics Solid State Physics |
ISBN | 3-319-92974-7 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- Basics of Metallic Magnetism -- Many-Electron Problem -- Mean-Field Theory -- Random-Phase Approximation -- Green Functions at Finite Temperatures -- Spin-Fluctuation Theory in the Ising Model -- Functional Integral Method -- Gaussian Approximation -- Single-Site Gaussian Approximation -- High-Temperature Theory -- Low-Temperature Theory -- Temperature Dependence of Magnetic Characteristics -- Neutron Scattering in Metals -- Short-Range Order Above TC -- Conclusion -- Appendices -- Index. |
Record Nr. | UNINA-9910300160803321 |
Melnikov Nikolai B | ||
Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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