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Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910789208203321 |
Rüeger Jean M
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger
| Electronic Distance Measurement [[electronic resource] ] : An Introduction / / by Jean M. Rüeger |
| Autore | Rüeger Jean M |
| Edizione | [4th ed. 1996.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 |
| Descrizione fisica | 1 online resource (XIX, 276 p.) |
| Disciplina | 526/.028 |
| Soggetto topico |
Geophysics
Geographical information systems Solid state physics Spectroscopy Microscopy Geophysics/Geodesy Geographical Information Systems/Cartography Solid State Physics Spectroscopy and Microscopy |
| ISBN | 3-642-80233-8 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | 1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. |
| Record Nr. | UNINA-9910820311303321 |
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Rüeger Jean M
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 1996 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Electronic Properties of Organic Conductors [[electronic resource] /] / by Takehiko Mori
| Electronic Properties of Organic Conductors [[electronic resource] /] / by Takehiko Mori |
| Autore | Mori Takehiko |
| Edizione | [1st ed. 2016.] |
| Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2016 |
| Descrizione fisica | 1 online resource (X, 356 p. 288 illus., 34 illus. in color.) |
| Disciplina |
620.11295
620.11297 |
| Soggetto topico |
Optical materials
Electronic materials Physical chemistry Solid state physics Organic chemistry Optical and Electronic Materials Physical Chemistry Solid State Physics Organic Chemistry |
| ISBN | 4-431-55264-2 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Quantum Chemistry of Molecules -- Quantum Chemistry of Solids -- Transport Properties -- Magnetism -- Electron Correlation -- Superconductivity -- Charge-Transfer Complexes -- Organic Semiconductors. |
| Record Nr. | UNINA-9910254039303321 |
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Mori Takehiko
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| Tokyo : , : Springer Japan : , : Imprint : Springer, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions [[electronic resource] /] / by Kazuto Akiba
| Electronic States of Narrow-Gap Semiconductors Under Multi-Extreme Conditions [[electronic resource] /] / by Kazuto Akiba |
| Autore | Akiba Kazuto |
| Edizione | [1st ed. 2019.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 |
| Descrizione fisica | 1 online resource (XXIV, 147 p. 91 illus., 56 illus. in color.) |
| Disciplina | 537.622 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Semiconductors
Optical materials Electronic materials Surfaces (Physics) Interfaces (Physical sciences) Thin films Materials science Solid state physics Optical and Electronic Materials Surface and Interface Science, Thin Films Characterization and Evaluation of Materials Solid State Physics |
| ISBN | 981-13-7107-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | General Introduction -- Experimental Methods -- Black Phosphorus -- Lead Telluride -- Concluding Remarks. |
| Record Nr. | UNINA-9910350229703321 |
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Akiba Kazuto
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| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2019 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Elektrische Messtechnik [[electronic resource] ] : Analoge, digitale und computergestützte Verfahren / / von Reinhard Lerch
| Elektrische Messtechnik [[electronic resource] ] : Analoge, digitale und computergestützte Verfahren / / von Reinhard Lerch |
| Autore | Lerch Reinhard |
| Edizione | [7th ed. 2016.] |
| Pubbl/distr/stampa | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer Vieweg, , 2016 |
| Descrizione fisica | 1 online resource (XXXI, 744 S. 533 Abb.) |
| Disciplina | 621.382 |
| Soggetto topico |
Signal processing
Image processing Speech processing systems Control engineering Robotics Mechatronics Solid state physics Spectroscopy Microscopy Physics Signal, Image and Speech Processing Control, Robotics, Mechatronics Solid State Physics Spectroscopy and Microscopy Numerical and Computational Physics, Simulation |
| ISBN | 3-662-46941-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | ger |
| Nota di contenuto | Umfang und Bedeutung der Elektrischen Messtechnik -- Die Grundlagen des Messens -- Ausgleichsvorgänge, Frequenz-Transformation und Vierpol-Übertragungsverhalten -- Nichtlineare Bauelemente, Schaltungen und Systeme -- Messfehler -- Analoges Messen elektrischer Größen -- Messverstärker -- Messung der elektrischen Leistung -- Messung von elektrischen Impedanzen -- Darstellung des Zeitverlaufs elektrischer Signale -- Digitale Messtechnik -- Die Messung von Frequenz und Zeit -- Messsignalverarbeitung -- Regression, lineare Korrelation und Hypothesen-Testverfahren -- Grundlagen der rechnergestützten Messdatenerfassung -- Messdatenerfassung im Labor -- Messdatenerfassung im Feld -- Vernetzung von Messdatenrechnern (Industri-LAN, WAN) -- Programmierung von Messdatenerfassungssystemen -- Gebäudeautomatisierung (Smart Home) -- Literatur- und Sachverzeichnis. |
| Record Nr. | UNINA-9910485153303321 |
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Lerch Reinhard
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| Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer Vieweg, , 2016 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Emerging Non-Volatile Memories [[electronic resource] /] / edited by Seungbum Hong, Orlando Auciello, Dirk Wouters
| Emerging Non-Volatile Memories [[electronic resource] /] / edited by Seungbum Hong, Orlando Auciello, Dirk Wouters |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | New York, NY : , : Springer US : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (280 p.) |
| Disciplina |
530.41
620.11 620.11295 620.11297 |
| Soggetto topico |
Optical materials
Electronic materials Solid state physics Spectroscopy Microscopy Electrical engineering Optical and Electronic Materials Solid State Physics Spectroscopy and Microscopy Electrical Engineering |
| ISBN | 1-4899-7537-3 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Part I: Ferroic Memories -- Review of the Science and Technology for Low and High-density Non-volatile Ferroelectric Memories -- Hybrid CMOS/magnetic memories (MRAM) and logic circuits -- Emerging Multi-Ferroic Memories -- Part II: Resistance and Phase Change Memories -- Phase-Change Materials for Data Storage Applications -- Emerging Oxide Resistance Change Memories -- Oxide based memristive nanodevices -- Part III: Probe Memories -- Ferroelectric Probe Storage Devices. |
| Record Nr. | UNINA-9910298659403321 |
| New York, NY : , : Springer US : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Emerging Trends in Terahertz Solid-State Physics and Devices [[electronic resource] ] : Sources, Detectors, Advanced Materials, and Light-matter Interactions / / edited by Arindam Biswas, Amit Banerjee, Aritra Acharyya, Hiroshi Inokawa, Jintendra Nath Roy
| Emerging Trends in Terahertz Solid-State Physics and Devices [[electronic resource] ] : Sources, Detectors, Advanced Materials, and Light-matter Interactions / / edited by Arindam Biswas, Amit Banerjee, Aritra Acharyya, Hiroshi Inokawa, Jintendra Nath Roy |
| Edizione | [1st ed. 2020.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XIV, 203 p. 134 illus., 108 illus. in color.) |
| Disciplina | 621.3813 |
| Soggetto topico |
Lasers
Photonics Solid state physics Biomedical engineering Nanotechnology Electronic circuits Signal processing Image processing Speech processing systems Optics, Lasers, Photonics, Optical Devices Solid State Physics Biomedical Engineering and Bioengineering Electronic Circuits and Devices Signal, Image and Speech Processing |
| ISBN | 981-15-3235-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1 - THz Bandpass Filter Design using Metamaterial-based Defected 1D Photonic Crystal Structure (Dr. Angsuman Sarkar) -- Chapter 2 - Terahertz Radiators Based on Silicon Carbide Avalanche Transit Time Sources – Part I: Large-Signal Characteristics (Dr. Aritra Acharyya) -- Chapter 3 - Terahertz Radiators Based on Silicon Carbide Avalanche Transit Time Sources – Part II: Avalanche Noise Characteristics (Dr. Aritra Acharyya) -- Chapter 4 - RF Performance of Ultra Wide Band Gap HEMTs (Dr. T R Lenka) -- Chapter 5 - Potentiality of Impact Avalanche Transit Time diode as Terahertz Source based on Group-IV and III-V semiconducting materials (Girish Chandra Ghivela) -- Chapter 6 - Analysis of InN based Surrounded gate tunnel field effect transistor for terahertz applications (Dr. Nitai Paitya) -- Chapter 7 - Thermoelectric Power in Heavily Doped Nano-Structures In The Presence of Terahertz Radiation (K P Ghatak) -- Chapter 8 - Heterostructure Devices for THz Signal Recognition (Dr. Manas Chand) -- Chapter 9 - Data transmission with Terahertz Communication Systems (Dr. Sudipta Das) -- Chapter 10 - Advances in Terahertz Imaging (Dr. Arijit Saha) -- Chapter 11 - Terahertz emission mechanisms in III-V semiconductors: The influence of isoelectronic dopants (Rajeev N. Kini and C. P. Vaisakh) -- Chapter 12 - Group III – Nitride and other semiconductor for terahertz detector(Bijit Choudhuri and Aniruddha Mondal). |
| Record Nr. | UNINA-9910410006203321 |
| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Emerging Trends in Terahertz Solid-State Physics and Devices [[electronic resource] ] : Sources, Detectors, Advanced Materials, and Light-matter Interactions / / edited by Arindam Biswas, Amit Banerjee, Aritra Acharyya, Hiroshi Inokawa, Jintendra Nath Roy
| Emerging Trends in Terahertz Solid-State Physics and Devices [[electronic resource] ] : Sources, Detectors, Advanced Materials, and Light-matter Interactions / / edited by Arindam Biswas, Amit Banerjee, Aritra Acharyya, Hiroshi Inokawa, Jintendra Nath Roy |
| Edizione | [1st ed. 2020.] |
| Pubbl/distr/stampa | Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 |
| Descrizione fisica | 1 online resource (XIV, 203 p. 134 illus., 108 illus. in color.) |
| Disciplina | 621.3813 |
| Soggetto topico |
Lasers
Photonics Solid state physics Biomedical engineering Nanotechnology Electronic circuits Signal processing Image processing Speech processing systems Optics, Lasers, Photonics, Optical Devices Solid State Physics Biomedical Engineering and Bioengineering Electronic Circuits and Devices Signal, Image and Speech Processing |
| ISBN | 981-15-3235-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Chapter 1 - THz Bandpass Filter Design using Metamaterial-based Defected 1D Photonic Crystal Structure (Dr. Angsuman Sarkar) -- Chapter 2 - Terahertz Radiators Based on Silicon Carbide Avalanche Transit Time Sources – Part I: Large-Signal Characteristics (Dr. Aritra Acharyya) -- Chapter 3 - Terahertz Radiators Based on Silicon Carbide Avalanche Transit Time Sources – Part II: Avalanche Noise Characteristics (Dr. Aritra Acharyya) -- Chapter 4 - RF Performance of Ultra Wide Band Gap HEMTs (Dr. T R Lenka) -- Chapter 5 - Potentiality of Impact Avalanche Transit Time diode as Terahertz Source based on Group-IV and III-V semiconducting materials (Girish Chandra Ghivela) -- Chapter 6 - Analysis of InN based Surrounded gate tunnel field effect transistor for terahertz applications (Dr. Nitai Paitya) -- Chapter 7 - Thermoelectric Power in Heavily Doped Nano-Structures In The Presence of Terahertz Radiation (K P Ghatak) -- Chapter 8 - Heterostructure Devices for THz Signal Recognition (Dr. Manas Chand) -- Chapter 9 - Data transmission with Terahertz Communication Systems (Dr. Sudipta Das) -- Chapter 10 - Advances in Terahertz Imaging (Dr. Arijit Saha) -- Chapter 11 - Terahertz emission mechanisms in III-V semiconductors: The influence of isoelectronic dopants (Rajeev N. Kini and C. P. Vaisakh) -- Chapter 12 - Group III – Nitride and other semiconductor for terahertz detector(Bijit Choudhuri and Aniruddha Mondal). |
| Record Nr. | UNISA-996418174403316 |
| Singapore : , : Springer Singapore : , : Imprint : Springer, , 2020 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. di Salerno | ||
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Engineering of Scintillation Materials and Radiation Technologies [[electronic resource] ] : Proceedings of ISMART 2016 / / edited by Mikhail Korzhik, Alexander Gektin
| Engineering of Scintillation Materials and Radiation Technologies [[electronic resource] ] : Proceedings of ISMART 2016 / / edited by Mikhail Korzhik, Alexander Gektin |
| Edizione | [1st ed. 2017.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2017 |
| Descrizione fisica | 1 online resource (XII, 339 p. 233 illus., 93 illus. in color.) |
| Disciplina | 620.11295 |
| Collana | Springer Proceedings in Physics |
| Soggetto topico |
Particle acceleration
Materials science Optical materials Electronic materials Spectroscopy Microscopy Physical measurements Measurement Solid state physics Particle Acceleration and Detection, Beam Physics Characterization and Evaluation of Materials Optical and Electronic Materials Spectroscopy and Microscopy Measurement Science and Instrumentation Solid State Physics |
| ISBN | 3-319-68465-5 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Acknowledgements -- Part 1 Fundamental Studies -- Microtheory of Scintillation in Crystalline Materials -- Fast Optical Phenomena in Self-activated and Ce-doped Materials Prospective for Fast Timing in Radiation Detectors -- Part 2 Material Science -- Crystal Clear Collaboration: 30 Years on the Development of the Scintillation Materials -- Nano-crystalline and Nano-composite Scintillators for Fast Timing -- Mixed Crystals - a Tool to Improve Scintillators Performance. Current Stats and Prospects -- Part 3 Technology and Production -- Raw Materials for Novel Complex Oxide Scintillators Development and Production -- Growth of Garnet and Perovskite Scintillator Crystals with Non-isovalent Minor Components and Related Effects -- Restart of PWO Production for HEP -- Engineering of YAG-based Scintillators -- Scintillation Crystals Growth Methods for Laboratory Research and Industrial Production -- Optical and Scintillation Properties of Ce-doped Glasses Obtained in the MO-SiO2 (M=Ca, Ba) System.-Composte Scintillation Elements -- Increasing the Radiation Resistance Threshold of the Plastic and Composite Scintillators -- Nanostructured Organosiliconluminophores as Effective and Fast Spectral Shifters in a Wide Spectral Region -- Part 4 Advanced Radiation Detectors and Detecting Systems -- Scintillation Detectors in Experiments on High Energy Physics -- Novel Designs of the Detecting Modules for High Luminosity LHC and FCC -- Energy Losses and Calorimetry with Oriented Crystals -- Scintillating Spectrometer for Long-term Study of theSsea Level Gamma-ray Background Variations Caused by Changes of Concentration of Radioactive Isotopes and Particle Acceleration During Thunderstorms -- Radiation Hard Electronics for Hadron Collider Experiments. LHC Experience and Projects for HL LHC -- Part 5 Instrumentation and Applications -- Demand for a New Instrumentation for Well Logging -- Portal Monitoring Devices -- New Developments of Radiation Monitoring Equipment on the Basis of Scintillation Detectors -- Glossary -- Index. |
| Record Nr. | UNINA-9910254603903321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2017 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Enhancing the Light Output of Solid-State Emitters [[electronic resource] /] / by Christopher Woodhead
| Enhancing the Light Output of Solid-State Emitters [[electronic resource] /] / by Christopher Woodhead |
| Autore | Woodhead Christopher |
| Edizione | [1st ed. 2018.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
| Descrizione fisica | 1 online resource (104 pages) |
| Disciplina | 535.15 |
| Collana | Springer Theses, Recognizing Outstanding Ph.D. Research |
| Soggetto topico |
Lasers
Photonics Solid state physics Quantum optics Optics, Lasers, Photonics, Optical Devices Solid State Physics Quantum Optics |
| ISBN | 3-319-95013-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- Background and Theory -- Experimental Methods and Techniques -- Enhancing the Photoluminescence of GaSb/GaAs QD Nano-structures -- Integration of III-V Based Type-II QDs with Silicon -- Increasing Light Extraction Using UV Curable SILs -- Conclusions. |
| Record Nr. | UNINA-9910300548603321 |
|
Woodhead Christopher
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| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Soggetto topico
-
Solid State Physics
(294)
- Solid state physics (294)
- Spectroscopy (86)
- Microscopy (84)
- Spectroscopy and Microscopy (84)