top

  Info

  • Utilizzare la checkbox di selezione a fianco di ciascun documento per attivare le funzionalità di stampa, invio email, download nei formati disponibili del (i) record.

  Info

  • Utilizzare questo link per rimuovere la selezione effettuata.
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
Autore Guinebretiere René
Pubbl/distr/stampa London ; ; Newport Beach, CA, : ISTE, 2007
Descrizione fisica 1 online resource (385 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico X-rays - Diffraction
Crystallography
ISBN 1-280-84764-6
9786610847648
0-470-61240-1
0-470-39453-6
1-84704-571-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample
Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples
2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors
2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε)
3.1.3. Spectral width: g3(ε)
Record Nr. UNISA-996217139303316
Guinebretiere René  
London ; ; Newport Beach, CA, : ISTE, 2007
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
Autore Guinebretiere René
Pubbl/distr/stampa London ; ; Newport Beach, CA, : ISTE, 2007
Descrizione fisica 1 online resource (385 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico X-rays - Diffraction
Crystallography
ISBN 1-280-84764-6
9786610847648
0-470-61240-1
0-470-39453-6
1-84704-571-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample
Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples
2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors
2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε)
3.1.3. Spectral width: g3(ε)
Record Nr. UNINA-9910830661603321
Guinebretiere René  
London ; ; Newport Beach, CA, : ISTE, 2007
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière
Autore Guinebretiere René
Pubbl/distr/stampa London ; ; Newport Beach, CA, : ISTE, 2007
Descrizione fisica 1 online resource (385 p.)
Disciplina 548.83
548/.83
Collana ISTE
Soggetto topico X-rays - Diffraction
Crystallography
ISBN 1-280-84764-6
9786610847648
0-470-61240-1
0-470-39453-6
1-84704-571-5
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample
Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples
2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors
2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε)
3.1.3. Spectral width: g3(ε)
Record Nr. UNINA-9910841037403321
Guinebretiere René  
London ; ; Newport Beach, CA, : ISTE, 2007
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
X-Ray Diffraction Imaging of Biological Cells [[electronic resource] /] / by Masayoshi Nakasako
X-Ray Diffraction Imaging of Biological Cells [[electronic resource] /] / by Masayoshi Nakasako
Autore Nakasako Masayoshi
Edizione [1st ed. 2018.]
Pubbl/distr/stampa Tokyo : , : Springer Japan : , : Imprint : Springer, , 2018
Descrizione fisica 1 online resource (XX, 228 p. 96 illus., 89 illus. in color.)
Disciplina 548.83
Collana Springer Series in Optical Sciences
Soggetto topico Lasers
Photonics
Materials science
Proteins 
Crystallography
Physical measurements
Measurement   
Optics, Lasers, Photonics, Optical Devices
Characterization and Evaluation of Materials
Protein Structure
Crystallography and Scattering Methods
Measurement Science and Instrumentation
ISBN 4-431-56618-X
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Nota di contenuto Introduction -- X-ray diffraction -- Theory of X-ray diffraction imaging -- Diffraction apparatus for X-ray diffraction imaging -- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature -- Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses -- Phase retrieval of diffraction patterns -- Projection structures of biological cells and organelles -- Three-dimensional structural analyses in cryogenic X-ray diffraction imaging -- Prospects for the structural analysis of biological specimens by X-ray diffraction imaging.
Record Nr. UNINA-9910300538303321
Nakasako Masayoshi  
Tokyo : , : Springer Japan : , : Imprint : Springer, , 2018
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Zeitschrift für Kristallographie New crystal structures
Zeitschrift für Kristallographie New crystal structures
Pubbl/distr/stampa München, : R. Oldenbourg Verlag, 1997-
Descrizione fisica 1 online resource
Soggetto topico Crystals - Structure
Crystals
Crystallography
Soggetto genere / forma Periodicals.
ISSN 2197-4578
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Record Nr. UNISA-996473266103316
München, : R. Oldenbourg Verlag, 1997-
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Zeitschrift für Kristallographie New crystal structures
Zeitschrift für Kristallographie New crystal structures
Pubbl/distr/stampa München, : R. Oldenbourg Verlag, 1997-
Descrizione fisica 1 online resource
Soggetto topico Crystals - Structure
Crystals
Crystallography
Soggetto genere / forma Periodicals.
ISSN 2197-4578
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Record Nr. UNINA-9910250057703321
München, : R. Oldenbourg Verlag, 1997-
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Zeitschrift für Kristallographie Crystalline materials
Zeitschrift für Kristallographie Crystalline materials
Pubbl/distr/stampa München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]-
Descrizione fisica online resources
Soggetto topico Crystals
Crystallography
Mineralogy
Soggetto genere / forma Periodicals.
ISSN 2196-7105
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti Zeitschrift für Kristallographie
Crystalline materials
Record Nr. UNISA-996277449003316
München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]-
Materiale a stampa
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Zeitschrift für Kristallographie Crystalline materials
Zeitschrift für Kristallographie Crystalline materials
Pubbl/distr/stampa München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]-
Descrizione fisica online resources
Soggetto topico Crystals
Crystallography
Mineralogy
Soggetto genere / forma Periodicals.
ISSN 2196-7105
Formato Materiale a stampa
Livello bibliografico Periodico
Lingua di pubblicazione eng
Altri titoli varianti Zeitschrift für Kristallographie
Crystalline materials
Record Nr. UNINA-9910799268603321
München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]-
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui