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| Titolo: |
Structural, Syntactic, and Statistical Pattern Recognition [[electronic resource] ] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder
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| Pubblicazione: | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2006 |
| Edizione: | 1st ed. 2006. |
| Descrizione fisica: | 1 online resource (XXI, 939 p.) |
| Disciplina: | 006.4 |
| Soggetto topico: | Pattern recognition |
| Computer science—Mathematics | |
| Artificial intelligence | |
| Computer graphics | |
| Optical data processing | |
| Pattern Recognition | |
| Discrete Mathematics in Computer Science | |
| Artificial Intelligence | |
| Computer Graphics | |
| Image Processing and Computer Vision | |
| Persona (resp. second.): | YeungDit-Yan |
| KwokJames T | |
| FredAna | |
| RoliFabio | |
| de RidderDick | |
| Note generali: | SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences. |
| Nota di bibliografia: | Includes bibliographical references and index. |
| Nota di contenuto: | Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers. |
| Titolo autorizzato: | Structural, Syntactic, and Statistical Pattern Recognition ![]() |
| ISBN: | 3-540-37241-5 |
| Formato: | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996465587203316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |