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Structural, Syntactic, and Statistical Pattern Recognition [[electronic resource] ] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder



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Titolo: Structural, Syntactic, and Statistical Pattern Recognition [[electronic resource] ] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder Visualizza cluster
Pubblicazione: Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2006
Edizione: 1st ed. 2006.
Descrizione fisica: 1 online resource (XXI, 939 p.)
Disciplina: 006.4
Soggetto topico: Pattern recognition
Computer science—Mathematics
Artificial intelligence
Computer graphics
Optical data processing
Pattern Recognition
Discrete Mathematics in Computer Science
Artificial Intelligence
Computer Graphics
Image Processing and Computer Vision
Persona (resp. second.): YeungDit-Yan
KwokJames T
FredAna
RoliFabio
de RidderDick
Note generali: SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
Titolo autorizzato: Structural, Syntactic, and Statistical Pattern Recognition  Visualizza cluster
ISBN: 3-540-37241-5
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996465587203316
Lo trovi qui: Univ. di Salerno
Opac: Controlla la disponibilità qui
Serie: Image Processing, Computer Vision, Pattern Recognition, and Graphics ; ; 4109