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Titolo: | Structural, Syntactic, and Statistical Pattern Recognition [[electronic resource] ] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder |
Pubblicazione: | Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2006 |
Edizione: | 1st ed. 2006. |
Descrizione fisica: | 1 online resource (XXI, 939 p.) |
Disciplina: | 006.4 |
Soggetto topico: | Pattern recognition |
Computer science—Mathematics | |
Artificial intelligence | |
Computer graphics | |
Optical data processing | |
Pattern Recognition | |
Discrete Mathematics in Computer Science | |
Artificial Intelligence | |
Computer Graphics | |
Image Processing and Computer Vision | |
Persona (resp. second.): | YeungDit-Yan |
KwokJames T | |
FredAna | |
RoliFabio | |
de RidderDick | |
Note generali: | SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences. |
Nota di bibliografia: | Includes bibliographical references and index. |
Nota di contenuto: | Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers. |
Titolo autorizzato: | Structural, Syntactic, and Statistical Pattern Recognition |
ISBN: | 3-540-37241-5 |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 996465587203316 |
Lo trovi qui: | Univ. di Salerno |
Opac: | Controlla la disponibilità qui |