03608nam 22007695 450 99646558720331620200705170253.03-540-37241-510.1007/11815921(CKB)1000000000233068(SSID)ssj0000320244(PQKBManifestationID)11238873(PQKBTitleCode)TC0000320244(PQKBWorkID)10342422(PQKB)11253495(DE-He213)978-3-540-37241-7(MiAaPQ)EBC3068050(PPN)123137241(EXLCZ)99100000000023306820100301d2006 u| 0engurnn#008mamaatxtccrStructural, Syntactic, and Statistical Pattern Recognition[electronic resource] Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder1st ed. 2006.Berlin, Heidelberg :Springer Berlin Heidelberg :Imprint: Springer,2006.1 online resource (XXI, 939 p.)Image Processing, Computer Vision, Pattern Recognition, and Graphics ;4109SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences.3-540-37236-9 Includes bibliographical references and index.Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.Image Processing, Computer Vision, Pattern Recognition, and Graphics ;4109Pattern recognitionComputer science—MathematicsArtificial intelligenceComputer graphicsOptical data processingPattern Recognitionhttps://scigraph.springernature.com/ontologies/product-market-codes/I2203XDiscrete Mathematics in Computer Sciencehttps://scigraph.springernature.com/ontologies/product-market-codes/I17028Artificial Intelligencehttps://scigraph.springernature.com/ontologies/product-market-codes/I21000Computer Graphicshttps://scigraph.springernature.com/ontologies/product-market-codes/I22013Image Processing and Computer Visionhttps://scigraph.springernature.com/ontologies/product-market-codes/I22021Pattern recognition.Computer science—Mathematics.Artificial intelligence.Computer graphics.Optical data processing.Pattern Recognition.Discrete Mathematics in Computer Science.Artificial Intelligence.Computer Graphics.Image Processing and Computer Vision.006.4Yeung Dit-Yanedthttp://id.loc.gov/vocabulary/relators/edtKwok James Tedthttp://id.loc.gov/vocabulary/relators/edtFred Anaedthttp://id.loc.gov/vocabulary/relators/edtRoli Fabioedthttp://id.loc.gov/vocabulary/relators/edtde Ridder Dickedthttp://id.loc.gov/vocabulary/relators/edtInternational Association for Pattern Recognition.International Workshop on Statistical Techniques in Pattern Recognition(6th :2006 :Hong Kong, China)BOOK996465587203316Structural, Syntactic, and Statistical Pattern Recognition772717UNISA