SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator / / Raymond Ladbury
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| Autore: |
Ladbury Raymond
|
| Titolo: |
SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator / / Raymond Ladbury
|
| Pubblicazione: | Greenbelt, Maryland : , : National Aeronautics and Space Administration, Goddard Space Flight Center, , June 2021 |
| Descrizione fisica: | 1 online resource (5 pages) : illustrations (some color) |
| Soggetto topico: | Electrical engineering |
| Electronics | |
| Note generali: | "June 2021." |
| "Test Engineer: Alyson Topper, Test Date: 24-27 October 2014, Report Date: 04 November 2014." | |
| Titolo autorizzato: | SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910716546503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |