01415nam 2200373 450 991071654650332120210624123131.0(CKB)5470000002522691(OCoLC)1257491604(EXLCZ)99547000000252269120210624j202106 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierSEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator /Raymond LadburyGreenbelt, Maryland :National Aeronautics and Space Administration, Goddard Space Flight Center,June 2021.1 online resource (5 pages) illustrations (some color)NASA/TM ;20210014982"June 2021.""Test Engineer: Alyson Topper, Test Date: 24-27 October 2014, Report Date: 04 November 2014."Electrical engineeringnasatElectronicsnasatElectrical engineering.Electronics.Ladbury Raymond1408969Goddard Space Flight Center,GPOGPOBOOK9910716546503321SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator3528772UNINA