Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

• Autore: Niknahad Mahtab
• Pubblicazione: KIT Scientific Publishing, 2013
• Descrizione fisica: 1 electronic resource (IX, 146 p. p.)
• Soggetto non controllato: Space; High reliability; FPGA; Redundancy; Single Event Upset
• Sommario/riassunto: Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
• Titolo autorizzato: Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
• ISBN: 1000035134
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910346864003321
• Lo trovi qui: Univ. Federico II