LEADER 01848nam  2200397z- 450 
001 9910346864003321
005 20210212
010   $a1000035134
035   $a(CKB)4920000000101876
035   $a(oapen)https://directory.doabooks.org/handle/20.500.12854/61792
035   $a(oapen)doab61792
035   $a(EXLCZ)994920000000101876
100   $a20202102d2013      |y         0
101 0 $aeng
135   $aurmn|---annan
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aUsing Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
210   $cKIT Scientific Publishing$d2013
215   $a1 online resource (IX, 146 p. p.)
225 1 $aSteinbuch Series on Advances in Information Technology / Karlsruher Institut für Technologie, Institut für Technik der Informationsverarbeitung
311 08$a3-7315-0038-8 
330   $aNowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
606   $aTechnology: general issues$2bicssc
610   $aFPGA
610   $aHigh reliability
610   $aRedundancy
610   $aSingle Event Upset
610   $aSpace
615  7$aTechnology: general issues
700   $aNiknahad$b Mahtab$4auth$01295477
906   $aBOOK
912   $a9910346864003321
996   $aUsing Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space$93023510
997   $aUNINA