The effect of experimental variables on industrial X-ray micro-computed sensitivity / / Donald J. Roth, Richard W. Rauser
(Visualizza in formato marc)
(Visualizza in BIBFRAME)
| Autore: |
Roth Don J.
|
| Titolo: |
The effect of experimental variables on industrial X-ray micro-computed sensitivity / / Donald J. Roth, Richard W. Rauser
|
| Pubblicazione: | Cleveland, Ohio : , : National Aeronautics and Space Administration, Glenn Research Center, , December 2014 |
| Descrizione fisica: | 1 online resource (37 pages) : color illustrations |
| Soggetto topico: | Radiography |
| Computer aided tomography | |
| X ray analysis | |
| Signal to noise ratios | |
| Modulation transfer function | |
| Persona (resp. second.): | RauserRichard W. |
| Note generali: | Title from title screen (viewed on May 15, 2015). |
| "December 2014." | |
| Nota di bibliografia: | Includes bibliographical references (page 37). |
| Titolo autorizzato: | The effect of experimental variables on industrial X-ray micro-computed sensitivity |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910703779403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |