01670nam 2200469I 450 991070377940332120150515085313.0(CKB)5470000002433924(OCoLC)909021363(EXLCZ)99547000000243392420150515j201412 ua 0engurcn|||||||||txtrdacontentcrdamediacrrdacarrierThe effect of experimental variables on industrial X-ray micro-computed sensitivity /Donald J. Roth, Richard W. RauserCleveland, Ohio :National Aeronautics and Space Administration, Glenn Research Center,December 2014.1 online resource (37 pages) color illustrationsNASA/TM ;2014-218332Title from title screen (viewed on May 15, 2015)."December 2014."Includes bibliographical references (page 37).RadiographynasatComputer aided tomographynasatX ray analysisnasatSignal to noise ratiosnasatModulation transfer functionnasatRadiography.Computer aided tomography.X ray analysis.Signal to noise ratios.Modulation transfer function.Roth Don J.1387267Rauser Richard W.NASA Glenn Research Center,GPOGPOBOOK9910703779403321The effect of experimental variables on industrial X-ray micro-computed sensitivity3540271UNINA