| Autore: |
Hanagal, David D.
|
| Titolo: |
Software Reliability Growth Models / David D. Hanagal, Nileema N. Bhalerao
|
| Pubblicazione: |
Singapore, : Springer, 2021 |
| Descrizione fisica: |
xxi, 104 p. : ill. ; 24 cm |
| Soggetto topico: |
60G55 - Point processes (e.g., Poisson, Cox, Hawkes processes) [MSC 2020] |
| |
68-XX - Computer science [MSC 2020] |
| |
68M15 - Reliability, testing and fault tolerance of networks and computer systems [MSC 2020] |
| |
68N01 - General topics in the theory of software [MSC 2020] |
| |
68Q87 - Probability in computer science (algorithm analysis, random structures, phase transitions, etc.) [MSC 2020] |
| |
68T05 - Learning and adaptive systems in artificial intelligence [MSC 2020] |
| Soggetto non controllato: |
Delayed s-shaped curve |
| |
Extended inverse Weibull |
| |
Fault content rate function |
| |
Generalized extended inverse Weibull |
| |
Generalized inverse Weibull |
| |
Hazard Rate |
| |
Imperfect debugging |
| |
Inverse Weibull |
| |
Mean value function |
| |
Model selection criteria |
| |
Non-homogeneous Poisson process |
| |
Predictive risk ratio |
| Altri autori: |
Bhalerao, Nileema N.
|
| Titolo autorizzato: |
Software Reliability Growth Models  |
| Formato: |
Materiale a stampa  |
| Livello bibliografico |
Monografia |
| Lingua di pubblicazione: |
Inglese |
| Record Nr.: | VAN00275518 |
| Lo trovi qui: | Univ. Vanvitelli |
| Localizzazioni e accesso elettronico |
https://doi.org/10.1007/978-981-16-0025-8 |
| Opac: |
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