LEADER 01036cam0 2200265 450 001 E600200009980 005 20230620063528.0 100 $a20050510d1989 |||||ita|0103 ba 101 $aita 102 $aIT 200 1 $a<>città industriosa$eRegole, Organizzazione Sociale ed Insediamenti delle Arti Industriali in Napoli tra Barocco e Rococò$fGennaro Borrelli 210 $aNapoli$cIstituto Statale d'Arte "Filippo Palizzi"$d1989 215 $a32 p.$d24 cm. 225 2 $aTaccuini di studi dell'Istituto "F$hPalizzi" 410 1$1001LAEC00021148$12001 $a*Taccuini di studi dell'Istituto "F. Palizzi" 700 1$aBorrelli$b, Gennaro$3AF00010467$4070$038391 801 0$aIT$bUNISOB$c20230620$gRICA 850 $aUNISOB 852 $aUNISOB$j700|Opusc$m96638 912 $aE600200009980 940 $aM 102 Monografia moderna SBN 941 $aM 957 $a700|Opusc$b000096$gSI$d96638$rDono$1pregresso3$2UNISOB$3UNISOB$420050510110900.0$520191203153755.0$6Spinosa 996 $aCittà industriosa$91671204 997 $aUNISOB LEADER 02639nam0 22005293i 450 001 VAN00275518 005 20240806101542.820 017 70$2N$a9789811600258 100 $a20240430d2021 |0itac50 ba 101 $aeng 102 $aSG 105 $a|||| ||||| 200 1 $aSoftware Reliability Growth Models$fDavid D. Hanagal, Nileema N. Bhalerao 210 $aSingapore$cSpringer$d2021 215 $axxi, 104 p.$cill.$d24 cm 410 1$1001VAN00108894$12001 $aInfosys Science Foundation Series$1210 $aCham [etc.]$cSpringer$d2015- 410 1$1001VAN00125139$12001 $aInfosys Science Foundation Series in Mathematical Sciences. Subseries$1210 $aBerlin [etc.]$cSpringer$d2016- 606 $a60G55$xPoint processes (e.g., Poisson, Cox, Hawkes processes) [MSC 2020]$3VANC024268$2MF 606 $a68-XX$xComputer science [MSC 2020]$3VANC019670$2MF 606 $a68M15$xReliability, testing and fault tolerance of networks and computer systems [MSC 2020]$3VANC021563$2MF 606 $a68N01$xGeneral topics in the theory of software [MSC 2020]$3VANC035632$2MF 606 $a68Q87$xProbability in computer science (algorithm analysis, random structures, phase transitions, etc.) [MSC 2020]$3VANC032889$2MF 606 $a68T05$xLearning and adaptive systems in artificial intelligence [MSC 2020]$3VANC023390$2MF 610 $aDelayed s-shaped curve$9KW:K 610 $aExtended inverse Weibull$9KW:K 610 $aFault content rate function$9KW:K 610 $aGeneralized extended inverse Weibull$9KW:K 610 $aGeneralized inverse Weibull$9KW:K 610 $aHazard Rate$9KW:K 610 $aImperfect debugging$9KW:K 610 $aInverse Weibull$9KW:K 610 $aMean value function$9KW:K 610 $aModel selection criteria$9KW:K 610 $aNon-homogeneous Poisson process$9KW:K 610 $aPredictive risk ratio$9KW:K 620 $aSG$dSingapore$3VANL000061 700 1$aHanagal$bDavid D.$3VANV098816$0782092 701 1$aBhalerao$bNileema N.$3VANV228000$01736726 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20241115$gRICA 856 4 $uhttps://doi.org/10.1007/978-981-16-0025-8$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00275518 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-Book 8533 $e08eMF8533 20240503 996 $aSoftware Reliability Growth Models$94156938 997 $aUNICAMPANIA