Error analysis and calibration uncertainty of capacitance standards at NIST [[electronic resource] /] / Y. May Chang
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| Autore: |
Chang Y. May
|
| Titolo: |
Error analysis and calibration uncertainty of capacitance standards at NIST [[electronic resource] /] / Y. May Chang
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, , [2000] |
| Descrizione fisica: | 1 online resource (1 volumes (various pagings)) : illustrations |
| Soggetto topico: | Capacitance meters - Calibration |
| Electric capacity - Standards - United States | |
| Note generali: | Title from title screen (viewed on Mar. 22, 2011). |
| Paper version no longer available for sale by the Supt. of Docs. | |
| "January 2000." | |
| Nota di bibliografia: | Includes bibliographical references (pages 38-39). |
| Titolo autorizzato: | Error analysis and calibration uncertainty of capacitance standards at NIST |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910700124303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |