LEADER 01613nam  2200409 a 450 
001 9910700124303321
005 20110322105439.0
035   $a(CKB)5470000002407726
035   $a(OCoLC)708037287
035   $a(EXLCZ)995470000002407726
100   $a20110322d2000      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aError analysis and calibration uncertainty of capacitance standards at NIST$b[electronic resource] /$fY. May Chang
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,$d[2000]
215   $a1 online resource (1 volumes (various pagings)) $cillustrations
225 1 $aNIST special publication ;$v250-52
225 1 $aNIST measurement services
300   $aTitle from title screen (viewed on Mar. 22, 2011).
300   $aPaper version no longer available for sale by the Supt. of Docs.
300   $a"January 2000."
320   $aIncludes bibliographical references (pages 38-39).
606   $aCapacitance meters$xCalibration
606   $aElectric capacity$xStandards$zUnited States
615  0$aCapacitance meters$xCalibration.
615  0$aElectric capacity$xStandards
700   $aChang$b Y. May$01390082
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910700124303321
996   $aError analysis and calibration uncertainty of capacitance standards at NIST$93442409
997   $aUNINA