Defects and diffusion in semiconductors . XI : an annual retrospective / / D.J. Fisher

• Pubblicazione: Stafa-Zuerich, Switzerland : , : TTP, Trans Tech Publications, , [2008]; ©2008
• Edizione: 1st ed.
• Descrizione fisica: 1 online resource (160 p.)
• Soggetto topico: Semiconductors - Defects; Semiconductors - Diffusion
• Altri autori: FisherD. J
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and indexes.
• Nota di contenuto: Defects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index
• Sommario/riassunto: This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.Balasubram
• Titolo autorizzato: Defects and diffusion in semiconductors
• ISBN: 3-03813-208-X
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910822485203321
• Lo trovi qui: Univ. Federico II
• Serie: Diffusion and defect data. : Pt. A, . -Defect and diffusion forum ; ; v. 282.