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100   $a20131101d2008      uy         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt
182   $cc
183   $acr
200 00$aDefects and diffusion in semiconductors$hXI $ean annual retrospective /$fD.J. Fisher
205   $a1st ed.
210  1$aStafa-Zuerich, Switzerland :$cTTP, Trans Tech Publications,$d[2008]
210  4$dİ2008
215   $a1 online resource (160 p.)
225 1 $aDefects and diffusion forum,$x1012-0386 ;$vv. 282
300   $aDescription based upon print version of record.
311   $a3-908451-63-9 
320   $aIncludes bibliographical references and indexes.
327   $aDefects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index
330   $aThis eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.Balasubram
410  0$aDiffusion and defect data.$nPt. A,$pDefect and diffusion forum ;$vv. 282.
606   $aSemiconductors$xDefects
606   $aSemiconductors$xDiffusion
615  0$aSemiconductors$xDefects.
615  0$aSemiconductors$xDiffusion.
701   $aFisher$b D. J$0727312
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910822485203321
996   $aDefects and diffusion in semiconductors$94040652
997   $aUNINA