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Frontiers in Optical Methods : Nano-Characterization and Coherent Control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors
| Frontiers in Optical Methods : Nano-Characterization and Coherent Control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors |
| Pubbl/distr/stampa | Berlin, : Springer, 2014 |
| Descrizione fisica | xii, 228 p. : ill. ; 24 cm |
| Soggetto topico |
78A55 - Technical applications of optics and electromagnetic theory [MSC 2020]
78-XX - Optics, electromagnetic theory [MSC 2020] 00A79 (77-XX) - Physics [MSC 2020] 00B15 - Collections of articles of miscellaneous specific interest [MSC 2020] 82D80 - Statistical mechanical studies of nanostructures and nanoparticles [MSC 2020] |
| Soggetto non controllato |
Extreme methods in optical measurements
Laser Microstructures Phonon techniques Surface differential reflectance spectroscopy Synchrotron Radiation THz spectroscopy Ultrafast spectroscopy Wave propagation in thin films X-ray technicques |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN0133211 |
| Berlin, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||
Frontiers in Optical Methods : Nano-Characterization and Coherent Control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors
| Frontiers in Optical Methods : Nano-Characterization and Coherent Control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors |
| Pubbl/distr/stampa | Berlin, : Springer, 2014 |
| Descrizione fisica | xii, 228 p. : ill. ; 24 cm |
| Soggetto topico |
00A79 (77-XX) - Physics [MSC 2020]
00B15 - Collections of articles of miscellaneous specific interest [MSC 2020] 78-XX - Optics, electromagnetic theory [MSC 2020] 78A55 - Technical applications of optics and electromagnetic theory [MSC 2020] 82D80 - Statistical mechanical studies of nanostructures and nanoparticles [MSC 2020] |
| Soggetto non controllato |
Extreme methods in optical measurements
Laser Microstructures Phonon techniques Surface differential reflectance spectroscopy Synchrotron Radiation THz spectroscopy Ultrafast spectroscopy Wave propagation in thin films X-ray technicques |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Titolo uniforme | |
| Record Nr. | UNICAMPANIA-VAN00133211 |
| Berlin, : Springer, 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||