LEADER 02363nam0 2200505 i 450 001 VAN0133211 005 20230623104554.184 017 70$2N$a9783642405945 100 $a20210407d2014 |0itac50 ba 101 $aeng 102 $aDE 105 $a|||| ||||| 200 1 $aFrontiers in Optical Methods$eNano-Characterization and Coherent Control$fKen-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno editors 210 $aBerlin$cSpringer$d2014 215 $axii, 228 p.$cill.$d24 cm 410 1$1001VAN0021015$12001 $aSpringer series in optical sciences$1210 $aBerlin [etc.]$cSpringer$v180 500 1$3VAN0157029$aFrontiers in Optical Methods$91770860 606 $a78A55$xTechnical applications of optics and electromagnetic theory [MSC 2020]$3VANC022118$2MF 606 $a78-XX$xOptics, electromagnetic theory [MSC 2020]$3VANC022356$2MF 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a00B15$xCollections of articles of miscellaneous specific interest [MSC 2020]$3VANC023985$2MF 606 $a82D80$xStatistical mechanical studies of nanostructures and nanoparticles [MSC 2020]$3VANC034005$2MF 610 $aExtreme methods in optical measurements$9KW:K 610 $aLaser$9KW:K 610 $aMicrostructures$9KW:K 610 $aPhonon techniques$9KW:K 610 $aSurface differential reflectance spectroscopy$9KW:K 610 $aSynchrotron Radiation$9KW:K 610 $aTHz spectroscopy$9KW:K 610 $aUltrafast spectroscopy$9KW:K 610 $aWave propagation in thin films$9KW:K 610 $aX-ray technicques$9KW:K 620 $dBerlin$3VANL000066 702 1$aKatayama$bIkufumui$3VANV106960 702 1$aOhno$bShin-Ya$3VANV106961 702 1$aShudo$bKen-ichi$3VANV106959 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttp://doi.org/10.1007/978-3-642-40594-5$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN0133211 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08CONS e-book 2141 $e08eMF2141 20210407 996 $aFrontiers in Optical Methods$91770860 997 $aUNICAMPANIA