System voltage potential-induced degradation mechanisms in PV modules and methods for test [[electronic resource] ] : preprint / / Peter Hacke ... [and others]

• Pubblicazione: [Golden, CO] : , : National Renewable Energy Laboratory, , [2011]
• Descrizione fisica: 1 online resource (7 pages) : illustrations (some color)
• Soggetto topico: Photovoltaic power generation - Equipment and supplies - Service life; Photovoltaic power systems - Reliability - Testing
• Altri autori: HackePeter
• Note generali: Title from title screen (viewed on Aug. 10, 2011).; "July 2011."; "Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
• Nota di bibliografia: Includes bibliographical references (pages 6-7).
• Altri titoli varianti: System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test
• Titolo autorizzato: System voltage potential-induced degradation mechanisms in PV modules and methods for test
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910703289503321
• Lo trovi qui: Univ. Federico II