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035   $a(EXLCZ)994330000001994611
100   $a20110811d2011      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aSystem voltage potential-induced degradation mechanisms in PV modules and methods for test$b[electronic resource] $epreprint /$fPeter Hacke ... [and others]
210  1$a[Golden, CO] :$cNational Renewable Energy Laboratory,$d[2011]
215   $a1 online resource (7 pages) $cillustrations (some color)
225 1 $aNREL/CP ;$v5200-50716
300   $aTitle from title screen (viewed on Aug. 10, 2011).
300   $a"July 2011."
300   $a"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
320   $aIncludes bibliographical references (pages 6-7).
517   $aSystem Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test 
606   $aPhotovoltaic power generation$xEquipment and supplies$xService life
606   $aPhotovoltaic power systems$xReliability$xTesting
615  0$aPhotovoltaic power generation$xEquipment and supplies$xService life.
615  0$aPhotovoltaic power systems$xReliability$xTesting.
701   $aHacke$b Peter$01396509
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aIEEE Photovoltaic Specialists Conference$d(37th :$f2011 :$eSeattle, Wash.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910703289503321
996   $aSystem voltage potential-induced degradation mechanisms in PV modules and methods for test$93533981
997   $aUNINA