Modeling minority-carrier lifetime techniques that use transient excess-carrier decay [[electronic resource] /] / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel
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| Autore: |
Johnston Steven W
|
| Titolo: |
Modeling minority-carrier lifetime techniques that use transient excess-carrier decay [[electronic resource] /] / Steven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel
|
| Pubblicazione: | Golden, Colo., : National Renewable Energy Laboratory, 2008 |
| Descrizione fisica: | 1 online resource (1 unnumbered page) : color illustrations |
| Soggetto topico: | Photovoltaic cells - Research |
| Solar cells - Research | |
| Excess carriers (Solid state physics) | |
| Altri autori: |
BermanGregory M
AhrenkielRichard K
|
| Note generali: | Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California. |
| Title from title screen (viewed on July 16, 2012). | |
| Altri titoli varianti: | Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay |
| Titolo autorizzato: | Modeling minority-carrier lifetime techniques that use transient excess-carrier decay |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910698699403321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |