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101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aModeling minority-carrier lifetime techniques that use transient excess-carrier decay$b[electronic resource] /$fSteven W. Johnston, Gregory M. Berman, and Richard K. Ahrenkiel
210   $aGolden, Colo. $cNational Renewable Energy Laboratory$d2008
215   $a1 online resource (1 unnumbered page) $ccolor illustrations
225 1 $aNREL/PO ;$v520-43308
300   $aPresented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California.
300   $aTitle from title screen (viewed on July 16, 2012).
517   $aModeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay 
606   $aPhotovoltaic cells$xResearch
606   $aSolar cells$xResearch
606   $aExcess carriers (Solid state physics)
615  0$aPhotovoltaic cells$xResearch.
615  0$aSolar cells$xResearch.
615  0$aExcess carriers (Solid state physics)
700   $aJohnston$b Steven W$01402712
701   $aBerman$b Gregory M$01402713
701   $aAhrenkiel$b Richard K$053728
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aIEEE Photovoltaic Specialists Conference$d(33rd :$f2008 :$eSan Diego, Calif.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910698699403321
996   $aModeling minority-carrier lifetime techniques that use transient excess-carrier decay$93473733
997   $aUNINA