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Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites / / D. G. Seiler, J. R. Lowney, W. R. Thurber, J. J. Kopanski, G. G. Harman
| Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites / / D. G. Seiler, J. R. Lowney, W. R. Thurber, J. J. Kopanski, G. G. Harman |
| Autore | Seiler David G |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
HarmanGeorge G
KopanskiJoseph LowneyJ. R SeilerDavid G ThurberW. Robert |
| Collana | NIST special publication |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711191703321 |
Seiler David G
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1994 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition / / Janet M. Cassard ... [and others]
| Standard Reference Materials(R) User's Guide for RM 8096 and 8097 : The MEMS 5-in-1, 2013 Edition / / Janet M. Cassard ... [and others] |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 |
| Descrizione fisica | 1 online resource (224 pages) : illustrations (color) |
| Altri autori (Persone) |
CassardJanet M
GaitanMichael GeistJon ReadD. T SeilerDavid G VorburgerTheodore V |
| Collana | NIST special publication |
| Soggetto topico | Physical measurements |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Standard Reference Materials |
| Record Nr. | UNINA-9910709585603321 |
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / / W. Murray Bullis, S. Perkowitz, D. G. Seiler
| Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / / W. Murray Bullis, S. Perkowitz, D. G. Seiler |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1995 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BullisW. Murray
PerkowitzSidney SeilerDavid G |
| Collana | NIST special publication |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711191303321 |
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Bullis W. Murray
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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