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Evolution of silicon materials characterization / / W. Murray Bullis
| Evolution of silicon materials characterization / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1993 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NIST special publication |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711191903321 |
Bullis W. Murray
|
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| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1993 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices : quarterly report October 1 to December 31, 1970 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices : quarterly report October 1 to December 31, 1970 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices |
| Record Nr. | UNINA-9910711390603321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices : quarterly report July 1 to September 30, 1970 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices : quarterly report July 1 to September 30, 1970 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices |
| Record Nr. | UNINA-9910711390703321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices : quarterly report January 1 to March 31, 1971 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices : quarterly report January 1 to March 31, 1971 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices |
| Record Nr. | UNINA-9910711389203321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, October 1 to December 31, 1969 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, October 1 to December 31, 1969 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1970 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices |
| Record Nr. | UNINA-9910711391003321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1970 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, July 1 to September 30, 1969 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices : Quarterly report, July 1 to September 30, 1969 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1970 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices |
| Record Nr. | UNINA-9910711391103321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1970 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices quarterly report : July 1 to September 30, 1972 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices quarterly report : July 1 to September 30, 1972 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
| Record Nr. | UNINA-9910711388503321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1973 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1973 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
| Record Nr. | UNINA-9910711388103321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices quarterly report : October 1 to December 31, 1972 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices quarterly report : October 1 to December 31, 1972 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
| Record Nr. | UNINA-9910711388303321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Methods of measurement for semiconductor materials, process control, and devices quarterly report : January 1 to March 31, 1973 / / W. Murray Bullis
| Methods of measurement for semiconductor materials, process control, and devices quarterly report : January 1 to March 31, 1973 / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBS technical note |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
| Record Nr. | UNINA-9910711388203321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
