X-ray and electron diffraction studies in materials science [[electronic resource] /] / D.J. Dyson |
Autore | Dyson D. J (David John) |
Pubbl/distr/stampa | London, : Maney for the Institute of Materials, Minerals, and Mining, c2004 |
Descrizione fisica | 1 online resource (376 p.) |
Disciplina | 620.11295 |
Soggetto topico |
Electrons - Diffraction
X-rays Crystallography |
ISBN | 1-907747-89-3 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Contents; INDEX; Foreword; REAL SPACE; CRYSTAL CHEMISTRY; THE INTENSITY OF DIFFRACTION; THE STEREOGRAPHIC PROJECTION; INSTRUMENT CONSIDERATIONS; LINE PROFILES; dS AND IS - PHASE IDENTIFICATION; QUANTITATIVE ANALYSIS; CRYSTALLITE SIZE ANALYSIS; THIN LAYERS; CRYSTALLOGRAPHIC TEXTURE; ELECTRON DIFFRACTION AND ITS RELATION TO XRD; APPENDIX - lA; APPENDIX - IB |
Record Nr. | UNINA-9910822899203321 |
Dyson D. J (David John) | ||
London, : Maney for the Institute of Materials, Minerals, and Mining, c2004 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
Autore | Guinebretiere René |
Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
Descrizione fisica | 1 online resource (385 p.) |
Disciplina |
548.83
548/.83 |
Collana | ISTE |
Soggetto topico |
X-rays - Diffraction
Crystallography |
ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
Record Nr. | UNINA-9910143313003321 |
Guinebretiere René | ||
London ; ; Newport Beach, CA, : ISTE, 2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
Autore | Guinebretiere René |
Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
Descrizione fisica | 1 online resource (385 p.) |
Disciplina |
548.83
548/.83 |
Collana | ISTE |
Soggetto topico |
X-rays - Diffraction
Crystallography |
ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
Record Nr. | UNISA-996217139303316 |
Guinebretiere René | ||
London ; ; Newport Beach, CA, : ISTE, 2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
Autore | Guinebretiere René |
Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
Descrizione fisica | 1 online resource (385 p.) |
Disciplina |
548.83
548/.83 |
Collana | ISTE |
Soggetto topico |
X-rays - Diffraction
Crystallography |
ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
Record Nr. | UNINA-9910830661603321 |
Guinebretiere René | ||
London ; ; Newport Beach, CA, : ISTE, 2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
X-ray diffraction by polycrystalline materials [[electronic resource] /] / René Guinebretière |
Autore | Guinebretiere René |
Pubbl/distr/stampa | London ; ; Newport Beach, CA, : ISTE, 2007 |
Descrizione fisica | 1 online resource (385 p.) |
Disciplina |
548.83
548/.83 |
Collana | ISTE |
Soggetto topico |
X-rays - Diffraction
Crystallography |
ISBN |
1-280-84764-6
9786610847648 0-470-61240-1 0-470-39453-6 1-84704-571-5 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto |
X-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron
1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample Chapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(ε); 3.1.2. Slit: g2(ε) 3.1.3. Spectral width: g3(ε) |
Record Nr. | UNINA-9910841037403321 |
Guinebretiere René | ||
London ; ; Newport Beach, CA, : ISTE, 2007 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
X-Ray Diffraction Imaging of Biological Cells [[electronic resource] /] / by Masayoshi Nakasako |
Autore | Nakasako Masayoshi |
Edizione | [1st ed. 2018.] |
Pubbl/distr/stampa | Tokyo : , : Springer Japan : , : Imprint : Springer, , 2018 |
Descrizione fisica | 1 online resource (XX, 228 p. 96 illus., 89 illus. in color.) |
Disciplina | 548.83 |
Collana | Springer Series in Optical Sciences |
Soggetto topico |
Lasers
Photonics Materials science Proteins Crystallography Physical measurements Measurement Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Protein Structure Crystallography and Scattering Methods Measurement Science and Instrumentation |
ISBN | 4-431-56618-X |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Nota di contenuto | Introduction -- X-ray diffraction -- Theory of X-ray diffraction imaging -- Diffraction apparatus for X-ray diffraction imaging -- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature -- Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses -- Phase retrieval of diffraction patterns -- Projection structures of biological cells and organelles -- Three-dimensional structural analyses in cryogenic X-ray diffraction imaging -- Prospects for the structural analysis of biological specimens by X-ray diffraction imaging. |
Record Nr. | UNINA-9910300538303321 |
Nakasako Masayoshi | ||
Tokyo : , : Springer Japan : , : Imprint : Springer, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Zeitschrift für Kristallographie New crystal structures |
Pubbl/distr/stampa | München, : R. Oldenbourg Verlag, 1997- |
Descrizione fisica | 1 online resource |
Soggetto topico |
Crystals - Structure
Crystals Crystallography |
Soggetto genere / forma | Periodicals. |
ISSN | 2197-4578 |
Formato | Materiale a stampa |
Livello bibliografico | Periodico |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996473266103316 |
München, : R. Oldenbourg Verlag, 1997- | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
Zeitschrift für Kristallographie New crystal structures |
Pubbl/distr/stampa | München, : R. Oldenbourg Verlag, 1997- |
Descrizione fisica | 1 online resource |
Soggetto topico |
Crystals - Structure
Crystals Crystallography |
Soggetto genere / forma | Periodicals. |
ISSN | 2197-4578 |
Formato | Materiale a stampa |
Livello bibliografico | Periodico |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910250057703321 |
München, : R. Oldenbourg Verlag, 1997- | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|
Zeitschrift für Kristallographie Crystalline materials |
Pubbl/distr/stampa | München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]- |
Descrizione fisica | online resources |
Soggetto topico |
Crystals
Crystallography Mineralogy |
Soggetto genere / forma | Periodicals. |
ISSN | 2196-7105 |
Formato | Materiale a stampa |
Livello bibliografico | Periodico |
Lingua di pubblicazione | eng |
Altri titoli varianti |
Zeitschrift für Kristallographie
Crystalline materials |
Record Nr. | UNISA-996277449003316 |
München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]- | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
Zeitschrift für Kristallographie Crystalline materials |
Pubbl/distr/stampa | München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]- |
Descrizione fisica | online resources |
Soggetto topico |
Crystals
Crystallography Mineralogy |
Soggetto genere / forma | Periodicals. |
ISSN | 2196-7105 |
Formato | Materiale a stampa |
Livello bibliografico | Periodico |
Lingua di pubblicazione | eng |
Altri titoli varianti |
Zeitschrift für Kristallographie
Crystalline materials |
Record Nr. | UNINA-9910799268603321 |
München : , : R. Oldenbourg Wissenschaftsverlag, , [2010]- | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
|