2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (79 pages) |
Disciplina | 621.3815 |
Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing |
ISBN | 1-5386-9466-2 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNISA-996280069103316 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. di Salerno | ||
|
2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China / / IEEE Computer Society |
Pubbl/distr/stampa | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
Descrizione fisica | 1 online resource (79 pages) |
Disciplina | 621.3815 |
Soggetto topico |
Electronic digital computers - Testing - Circuits
Electronic circuits - Testing Fault-tolerant computing |
ISBN | 1-5386-9466-2 |
Formato | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910296457603321 |
Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 | ||
Materiale a stampa | ||
Lo trovi qui: Univ. Federico II | ||
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