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Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy [[electronic resource] ] : Proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 / / edited by Philip Moriarty, Sebastien Gauthier
| Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy [[electronic resource] ] : Proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 / / edited by Philip Moriarty, Sebastien Gauthier |
| Edizione | [1st ed. 2015.] |
| Pubbl/distr/stampa | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 |
| Descrizione fisica | 1 online resource (169 p.) |
| Disciplina |
54
541.2 620.5 |
| Collana | Advances in Atom and Single Molecule Machines |
| Soggetto topico |
Nanochemistry
Nanoscale science Nanoscience Nanostructures Nanoscale Science and Technology |
| ISBN | 3-319-17401-0 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Pauli's Principle in Probe Microscopy -- Mechanical and Electrical Properties of Single Molecules -- Atom Manipulation Using Atomic Force Microscopy at Room Temperature -- A Considered Approach to Force Extraction from Dynamic Force Microscopy Measurements -- Theoretical Challenges of Simultaneous NC-AFM/STM Experiments -- Manipulation of Metal Nanoparticles on Insulating Surfaces -- Imaging of Defects on Ge(001):H by Non-Contact Atomic Force Microscopy -- Adsorption Structures of Amino Acids on Calcite(104) -- NC-AFM and KPFM Study of the Adsorption of a Triphenylene Derivative on KBr(001). |
| Record Nr. | UNINA-9910298610003321 |
| Cham : , : Springer International Publishing : , : Imprint : Springer, , 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy : Proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 / editors Philip Moriarty, Sebastien Gauthier
| Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy : Proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 / editors Philip Moriarty, Sebastien Gauthier |
| Pubbl/distr/stampa | Cham, : Springer, 2015 |
| Descrizione fisica | XX, 154 p. : ill. ; 24 cm |
| Disciplina |
540(Chimica generale)
620.5(Nanotecnologia) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN0241795 |
| Cham, : Springer, 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
| ||