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Semiconductor technology program : progress briefs / / W. Murray Bullis
| Semiconductor technology program : progress briefs / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBSIR |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor technology program |
| Record Nr. | UNINA-9910710222203321 |
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor technology program : progress briefs / / W. Murray Bullis
| Semiconductor technology program : progress briefs / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor technology program |
| Record Nr. | UNINA-9910710239803321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor technology program : progress briefs / / W. Murray Bullis
| Semiconductor technology program : progress briefs / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor technology program |
| Record Nr. | UNINA-9910709909103321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1979 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Semiconductor technology program : progress briefs / / W. Murray Bullis
| Semiconductor technology program : progress briefs / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Altri titoli varianti | Semiconductor technology program |
| Record Nr. | UNINA-9910710297203321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1978 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Standard measurements of the resistivity of silicon by the four-probe method / / W. Murray Bullis
| Standard measurements of the resistivity of silicon by the four-probe method / / W. Murray Bullis |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1974 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) | BullisW. Murray |
| Collana | NBSIR |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910710067103321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1974 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / / W. Murray Bullis, S. Perkowitz, D. G. Seiler
| Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry / / W. Murray Bullis, S. Perkowitz, D. G. Seiler |
| Autore | Bullis W. Murray |
| Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1995 |
| Descrizione fisica | 1 online resource |
| Altri autori (Persone) |
BullisW. Murray
PerkowitzSidney SeilerDavid G |
| Collana | NIST special publication |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910711191303321 |
|
Bullis W. Murray
|
||
| Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1995 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
| ||
