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Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1972 / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1972 / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Methods of measurement for semiconductor materials, process control, and devices quarterly report
Record Nr. UNINA-9910711388703321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices quarterly report : October 1 to December 30, 1971 / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices quarterly report : October 1 to December 30, 1971 / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Methods of measurement for semiconductor materials, process control, and devices quarterly report
Record Nr. UNINA-9910711388903321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices quarterly report : January 1 to March 30, 1972 / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices quarterly report : January 1 to March 30, 1972 / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Methods of measurement for semiconductor materials, process control, and devices quarterly report
Record Nr. UNINA-9910711388803321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices quarterly report : July 1 to September 30, 1971 / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices quarterly report : July 1 to September 30, 1971 / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Methods of measurement for semiconductor materials, process control, and devices quarterly report
Record Nr. UNINA-9910711389003321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1971 / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1971 / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Altri titoli varianti Methods of measurement for semiconductor materials, process control, and devices quarterly report
Record Nr. UNINA-9910711389103321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969. / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969. / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910711391503321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, January 1 to March 31, 1969. / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, January 1 to March 31, 1969. / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910711391603321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, October 1 to December 31, 1968. / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, October 1 to December 31, 1968. / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910711391703321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Methods of measurement for semiconductor materials, process control, and devices. / / W. Murray Bullis
Methods of measurement for semiconductor materials, process control, and devices. / / W. Murray Bullis
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1968
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
Collana NBS technical note
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910711391803321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1968
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
The NBS semiconductor technology program and VLSI / / W. Murray Bullis; R. I. Scace
The NBS semiconductor technology program and VLSI / / W. Murray Bullis; R. I. Scace
Autore Bullis W. Murray
Pubbl/distr/stampa Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980
Descrizione fisica 1 online resource
Altri autori (Persone) BullisW. Murray
ScaceR. I
Collana NBSIR
Formato Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione eng
Record Nr. UNINA-9910710232703321
Bullis W. Murray  
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980
Materiale a stampa
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui