Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1972 / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
Record Nr. | UNINA-9910711388703321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices quarterly report : October 1 to December 30, 1971 / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
Record Nr. | UNINA-9910711388903321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices quarterly report : January 1 to March 30, 1972 / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
Record Nr. | UNINA-9910711388803321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices quarterly report : July 1 to September 30, 1971 / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
Record Nr. | UNINA-9910711389003321 |
Bullis W. Murray
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||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1972 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Methods of measurement for semiconductor materials, process control, and devices quarterly report : April 1 to June 30, 1971 / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Altri titoli varianti | Methods of measurement for semiconductor materials, process control, and devices quarterly report |
Record Nr. | UNINA-9910711389103321 |
Bullis W. Murray
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||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1971 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969. / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711391503321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, January 1 to March 31, 1969. / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711391603321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 | ||
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Lo trovi qui: Univ. Federico II | ||
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Methods of measurement for semiconductor materials, process control, and devices, quarterly report, October 1 to December 31, 1968. / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711391703321 |
Bullis W. Murray
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||
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1969 | ||
![]() | ||
Lo trovi qui: Univ. Federico II | ||
|
Methods of measurement for semiconductor materials, process control, and devices. / / W. Murray Bullis |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1968 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) | BullisW. Murray |
Collana | NBS technical note |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910711391803321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1968 | ||
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Lo trovi qui: Univ. Federico II | ||
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The NBS semiconductor technology program and VLSI / / W. Murray Bullis; R. I. Scace |
Autore | Bullis W. Murray |
Pubbl/distr/stampa | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 |
Descrizione fisica | 1 online resource |
Altri autori (Persone) |
BullisW. Murray
ScaceR. I |
Collana | NBSIR |
Formato | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione | eng |
Record Nr. | UNINA-9910710232703321 |
Bullis W. Murray
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1980 | ||
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Lo trovi qui: Univ. Federico II | ||
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