Vai al contenuto principale della pagina
Autore: | Young David L |
Titolo: | Unusual capacitance emission transients in CIGS caused by large defect entropy changes [[electronic resource] /] / D.L. Young, K. Ramanathan, and R.S. Crandall |
Pubblicazione: | Golden, Colo. : , : National Renewable Energy Laboratory, , [2005] |
Descrizione fisica: | 4 pages : digital, PDF file |
Soggetto topico: | Solar cells - Materials - Effect of temperature on |
Altri autori: | RamanathanKannan CrandallRichard S |
Note generali: | Title from title screen (viewed on May 9, 2006). |
"February 2005." | |
2005-08-21. | |
Sommario/riassunto: | Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more complete Gibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS. |
Titolo autorizzato: | Unusual capacitance emission transients in CIGS caused by large defect entropy changes |
Formato: | Materiale a stampa |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910698268703321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |