02031oam 2200433Ka 450 991069826870332120090323090419.0(CKB)4330000002011072(OCoLC)68230222(EXLCZ)99433000000201107220060505d2005 ua 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierUnusual capacitance emission transients in CIGS caused by large defect entropy changes[electronic resource] /D.L. Young, K. Ramanathan, and R.S. CrandallGolden, Colo. :National Renewable Energy Laboratory,[2005]4 pages digital, PDF fileConference paper ;NREL/CP-520-37359Title from title screen (viewed on May 9, 2006)."February 2005."2005-08-21.Capacitance transient data from bias-pulse experiments on CdS/CIGS solar cells show an unusual behavior at high temperatures. Above 350 K, a minority-carrier trap, with a larger activation energy than a majority-carrier trap, emits faster than the lower activation-energy minority trap. A simple enthalpy model for trap emission cannot explain this counterintuitive behavior; but the more complete Gibbs free-energy model that includes entropy can explain it. We show that entropy plays a major role in carrier emission from traps in CIGS.Solar cellsMaterialsEffect of temperature onSolar cellsMaterialsEffect of temperature on.Young David L1385248Ramanathan Kannan1382425Crandall Richard S21185National Renewable Energy Laboratory (U.S.)DOXDOXGPOSYBGPOBOOK9910698268703321Unusual capacitance emission transients in CIGS caused by large defect entropy changes3432569UNINA