Monte Carlo modeling for electron microscopy and microanalysis [[electronic resource] /] / David C. Joy

• Autore: Joy David C. <1943->
• Pubblicazione: New York, : Oxford University Press, 1995
• Descrizione fisica: 1 online resource (225 p.)
• Disciplina: 502/.8/25
• Soggetto topico: Electron microscopy - Computer simulation; Electron probe microanalysis - Computer simulation; Monte Carlo method
• Soggetto genere / forma: Electronic books.
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references.
• Nota di contenuto: Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index
• Sommario/riassunto: 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
• Titolo autorizzato: Monte Carlo modeling for electron microscopy and microanalysis
• ISBN: 1-280-53489-3; 9786610534890; 0-19-535846-5
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910451259803321
• Lo trovi qui: Univ. Federico II
• Serie: Oxford series in optical and imaging sciences ; ; 9.