02810nam 2200625Ia 450 991045125980332120200520144314.01-280-53489-397866105348900-19-535846-5(CKB)1000000000405107(EBL)430981(OCoLC)435816746(SSID)ssj0000205322(PQKBManifestationID)11171163(PQKBTitleCode)TC0000205322(PQKBWorkID)10191880(PQKB)10633086(MiAaPQ)EBC430981(Au-PeEL)EBL430981(CaPaEBR)ebr10358552(CaONFJC)MIL53489(EXLCZ)99100000000040510719940915d1995 uy 0engur|n|---|||||txtccrMonte Carlo modeling for electron microscopy and microanalysis[electronic resource] /David C. JoyNew York Oxford University Press19951 online resource (225 p.)Oxford series in optical and imaging sciences ;9Description based upon print version of record.0-19-508874-3 Includes bibliographical references.Contents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?Oxford series in optical and imaging sciences ;9.Electron microscopyComputer simulationElectron probe microanalysisComputer simulationMonte Carlo methodElectronic books.Electron microscopyComputer simulation.Electron probe microanalysisComputer simulation.Monte Carlo method.502/.8/25Joy David C.1943-986272MiAaPQMiAaPQMiAaPQBOOK9910451259803321Monte Carlo modeling for electron microscopy and microanalysis2254186UNINA