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Research on the Radiation Effects and Compact Model of SiGe HBT [[electronic resource] /] / by Yabin Sun



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Autore: Sun Yabin Visualizza persona
Titolo: Research on the Radiation Effects and Compact Model of SiGe HBT [[electronic resource] /] / by Yabin Sun Visualizza cluster
Pubblicazione: Singapore : , : Springer Singapore : , : Imprint : Springer, , 2018
Edizione: 1st ed. 2018.
Descrizione fisica: 1 online resource (XXIV, 168 p. 171 illus.)
Disciplina: 621.381528
Soggetto topico: Electronics
Microelectronics
Semiconductors
Optical materials
Electronic materials
Electronic circuits
Solid state physics
Electronics and Microelectronics, Instrumentation
Optical and Electronic Materials
Electronic Circuits and Devices
Solid State Physics
Nota di bibliografia: Includes bibliographical references at the end of each chapters and index.
Nota di contenuto: Introduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion.
Sommario/riassunto: This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.
Titolo autorizzato: Research on the Radiation Effects and Compact Model of SiGe HBT  Visualizza cluster
ISBN: 981-10-4612-3
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910299567203321
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Serie: Springer Theses, Recognizing Outstanding Ph.D. Research, . 2190-5053