Advanced Transmission Electron Microscopy [[electronic resource] ] : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence
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| Autore: |
Zuo Jian Min
|
| Titolo: |
Advanced Transmission Electron Microscopy [[electronic resource] ] : Imaging and Diffraction in Nanoscience / / by Jian Min Zuo, John C.H. Spence
|
| Pubblicazione: | New York, NY : , : Springer New York : , : Imprint : Springer, , 2017 |
| Edizione: | 1st ed. 2017. |
| Descrizione fisica: | 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) |
| Disciplina: | 502.825 |
| Soggetto topico: | Materials science |
| Lasers | |
| Photonics | |
| Nanochemistry | |
| Nanoscale science | |
| Nanoscience | |
| Nanostructures | |
| Nanotechnology | |
| Solid state physics | |
| Characterization and Evaluation of Materials | |
| Optics, Lasers, Photonics, Optical Devices | |
| Nanoscale Science and Technology | |
| Solid State Physics | |
| Persona (resp. second.): | SpenceJohn C.H |
| Note generali: | Includes index. |
| Nota di contenuto: | Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes. |
| Sommario/riassunto: | This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns. |
| Titolo autorizzato: | Advanced Transmission Electron Microscopy |
| ISBN: | 1-4939-6607-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910254141103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |