LEADER 01837nas 2200577 a 450 001 996214840803316 005 20221206222641.0 011 $a1873-2119 035 $a(OCoLC)45280970 035 $a(CKB)954925527838 035 $a(CONSER) 2003233289 035 $a(DE-599)ZDB1466577-3 035 $a(EXLCZ)99954925527838 100 $a20001103a19759999 sy a 101 0 $aeng 135 $aurun|||||| 200 10$aPhysica A$b[e-journal] $etheoretical and statistical physics 210 $aAmsterdam $cElsevier Science 300 $aSome issues also have distinctive titles. 300 $aRefereed/Peer-reviewed 311 $a0378-4371 517 $aPhysica A 517 1 $aTheoretical and statistical physics 517 1 $aStatistical and theoretical physics 517 1 $aStatistical mechanics and its applications 517 1 $aPhysica. 517 1 $aPhysica. 517 1 $aPhysica. 517 1 $aStatistical and theoretical physics 517 1 $aStatistical mechanics and its applications 517 $aPhysica A: Statistical Mechanics and its Applications 531 $aPHYS. A 531 $aPHYSICA A THEORETICAL AND STATISTICAL PHYSICS 531 $aPHYSICA A STATISTICAL AND THEORETICAL PHYSICS 531 $aPHYSICA SECTION A 531 $aPHYS A STAT THEOR PHYS 531 $aPHYSICA A 531 $aPHYSICA A STATISTICAL MECHANICS AND ITS APPLICATIONS 531 0 $aPhysica, A 606 $aMathematical physics$vPeriodicals 606 $aPhysics$vPeriodicals 606 $aStatistical physics$vPeriodicals 608 $aPeriodicals. 615 0$aMathematical physics 615 0$aPhysics 615 0$aStatistical physics 712 02$aEuropean Physical Society. 906 $aJOURNAL 912 $a996214840803316 996 $aPhysica A$9789544 997 $aUNISA LEADER 04428nam 22008175 450 001 9910254141103321 005 20200701001410.0 010 $a1-4939-6607-3 024 7 $a10.1007/978-1-4939-6607-3 035 $a(CKB)3710000000926232 035 $a(DE-He213)978-1-4939-6607-3 035 $a(MiAaPQ)EBC6315079 035 $a(MiAaPQ)EBC5576264 035 $a(Au-PeEL)EBL5576264 035 $a(OCoLC)1066179324 035 $a(PPN)196320887 035 $a(EXLCZ)993710000000926232 100 $a20161026d2017 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAdvanced Transmission Electron Microscopy $eImaging and Diffraction in Nanoscience /$fby Jian Min Zuo, John C.H. Spence 205 $a1st ed. 2017. 210 1$aNew York, NY :$cSpringer New York :$cImprint: Springer,$d2017. 215 $a1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) 300 $aIncludes index. 311 $a1-4939-6605-7 327 $aIntroduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes. 330 $aThis volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns. 606 $aMaterials science 606 $aLasers 606 $aPhotonics 606 $aNanochemistry 606 $aNanoscience 606 $aNanoscience 606 $aNanostructures 606 $aNanotechnology 606 $aSolid state physics 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aOptics, Lasers, Photonics, Optical Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31030 606 $aNanochemistry$3https://scigraph.springernature.com/ontologies/product-market-codes/C33000 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aSolid State Physics$3https://scigraph.springernature.com/ontologies/product-market-codes/P25013 615 0$aMaterials science. 615 0$aLasers. 615 0$aPhotonics. 615 0$aNanochemistry. 615 0$aNanoscience. 615 0$aNanoscience. 615 0$aNanostructures. 615 0$aNanotechnology. 615 0$aSolid state physics. 615 14$aCharacterization and Evaluation of Materials. 615 24$aOptics, Lasers, Photonics, Optical Devices. 615 24$aNanochemistry. 615 24$aNanoscale Science and Technology. 615 24$aNanotechnology. 615 24$aSolid State Physics. 676 $a502.825 700 $aZuo$b Jian Min$4aut$4http://id.loc.gov/vocabulary/relators/aut$0959455 702 $aSpence$b John C.H$4aut$4http://id.loc.gov/vocabulary/relators/aut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910254141103321 996 $aAdvanced Transmission Electron Microscopy$92174109 997 $aUNINA