X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken

• Pubblicazione: Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004
• Descrizione fisica: 1 online resource (617 p.)
• Disciplina: 543.08586; 543.62; 543/.62
• Soggetto topico: X-ray spectroscopy
• Soggetto genere / forma: Electronic books.
• Altri autori: TsujiKouichi InjukJasna GriekenR. van (René)
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy ; 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy ; 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry ; Index
• Sommario/riassunto: X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-raysIntroduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trendsWritten by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fieldsSections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Spec
• Titolo autorizzato: X-ray spectrometry
• ISBN: 1-280-23888-7; 9786610238880; 0-470-02042-3; 0-470-02043-1
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910146051803321
• Lo trovi qui: Univ. Federico II