| |
|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910146051803321 |
|
|
Titolo |
X-ray spectrometry [[electronic resource] ] : recent technological advances / / edited by Kouichi Tsuji, Jasna Injuk, René Van Grieken |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
Chichester, West Sussex, England ; ; Hoboken, NJ, USA, : Wiley, c2004 |
|
|
|
|
|
|
|
ISBN |
|
1-280-23888-7 |
9786610238880 |
0-470-02042-3 |
0-470-02043-1 |
|
|
|
|
|
|
|
|
Descrizione fisica |
|
1 online resource (617 p.) |
|
|
|
|
|
|
Altri autori (Persone) |
|
TsujiKouichi |
InjukJasna |
GriekenR. van (René) |
|
|
|
|
|
|
|
|
Disciplina |
|
|
|
|
|
|
|
|
Soggetti |
|
X-ray spectroscopy |
Electronic books. |
|
|
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Note generali |
|
Description based upon print version of record. |
|
|
|
|
|
|
Nota di bibliografia |
|
Includes bibliographical references and index. |
|
|
|
|
|
|
Nota di contenuto |
|
X-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy |
4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray |
|
|
|
|
|
|
|
|
|
|
|
Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy |
5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry |
Index |
|
|
|
|
|
|
Sommario/riassunto |
|
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-raysIntroduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trendsWritten by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fieldsSections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Spec |
|
|
|
|
|
|
|
| |