Structure from diffraction methods / / edited by Duncan W. Bruce, Dermot O'Hare, Richard I. Walton

• Pubblicazione: West Sussex, England : , : John Wiley & Sons, Ltd., , 2014; ©2014
• Descrizione fisica: 1 online resource (705 p.)
• Disciplina: 541/.22
• Soggetto topico: Molecular structure; X-rays - Diffraction; Inorganic compounds - Spectra
• Classificazione: TEC021000
• Persona (resp. second.): BruceDuncan W.; O'HareDermot; WaltonRichard I.
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Cover; Inorganic Materials Series; Title Page; Copyright; Inorganic Materials Series Preface; Preface; List of Contributors; Chapter 1: Powder Diffraction; 1.1 INTRODUCTION; 1.2 THE SIMILARITIES AND DIFFERENCES BETWEEN SINGLE-CRYSTAL XRD AND POWDER XRD; 1.3 QUALITATIVE ASPECTS OF POWDER XRD: 'FINGERPRINTING' OF CRYSTALLINE PHASES; 1.4 QUANTITATIVE ASPECTS OF POWDER XRD: SOME PRELIMINARIES RELEVANT TO CRYSTAL STRUCTURE DETERMINATION; 1.5 STRUCTURE DETERMINATION FROM POWDER XRD DATA; 1.6 SOME EXPERIMENTAL CONSIDERATIONS IN POWDER XRD; 1.7 POWDER NEUTRON DIFFRACTION VERSUS POWDER XRD ; 1.8 VALIDATION OF PROCEDURES AND RESULTS IN STRUCTURE DETERMINATION FROM POWDER XRD DATA1.9 MORE DETAILED CONSIDERATION OF THE APPLICATION OF POWDER XRD AS A 'FINGERPRINT' OF CRYSTALLINE PHASES; 1.10 EXAMPLES OF THE APPLICATION OF POWDER XRD IN CHEMICAL CONTEXTS; 1.11 CONCLUDING REMARKS; References; Chapter 2: X-Ray and Neutron Single-Crystal Diffraction; 2.1 Introduction; 2.2 Solid-State Fundamentals; 2.3 Scattering and Diffraction; 2.4 Experimental Methods; 2.5 STRUCTURE SOLUTION; 2.6 Structure Refinement; 2.7 Problem Structures, Special Topics, Validation and Interpretation ; Software AcknowledgementsReferences; Chapter 3: PDF Analysis of Nanoparticles; 3.1 INTRODUCTION; 3.2 PAIR DISTRIBUTION FUNCTION; 3.3 DATA COLLECTION STRATEGIES; 3.4 DATA TREATMENT; 3.5 EXAMPLES; 3.6 COMPLEMENTARY TECHNIQUES; References; Chapter 4: Electron Crystallography; 4.1 INTRODUCTION; 4.2 CRYSTAL DESCRIPTION; 4.3 ELECTRON MICROSCOPY; 4.4 ELECTRON DIFFRACTION; 4.5 IMAGING; 4.6 THE EC METHOD OF SOLVING CRYSTAL STRUCTURES; 4.7 OTHER TEM TECHNIQUES; 4.8 CONCLUSION; References; ACKNOWLEDGMENT; Chapter 5: Small-Angle Scattering; 5.1 INTRODUCTION; 5.2 GENERAL PRINCIPLES OF SAS ; 5.3 INSTRUMENTAL SET-UP FOR SAXS5.4 INSTRUMENTAL SET-UP FOR SANS; 5.5 ADDITIONAL REQUIREMENTS FOR SAS; 5.6 APPLICATION OF SAS METHODS; 5.7 CONCLUSION; Acknowledgements; References; Index; End User License Agreement
• Sommario/riassunto: "Part of the highly successful Inorganic Materials Series, this new title deals with recent advances in the characterisation of crystalline materials. This very timely volume complements the Series which has so far focused on particular classes of materials (synthesis, structures, chemistry and properties) by introducing and reviewing state-of-art techniques for materials characterisation.Written by experts from around the world, methods reviewed include spectroscopic, diffraction and surface techniques that examine the structure of materials on all length scales, from local atomic structure to long-range crystallographic order"--; "Part of the successful Inorganic Materials Series, this is a unique collection of books which provide an up-to-date review of key aspects of materials chemistry"--
• Titolo autorizzato: Structure from diffraction methods
• ISBN: 1-118-69570-4; 1-118-68249-1; 1-118-69571-2
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910132191903321
• Lo trovi qui: Univ. Federico II
• Serie: Inorganic materials series.