VLSI Test Symposium, 14th IEEE (VTS '96
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| Titolo: |
VLSI Test Symposium, 14th IEEE (VTS '96
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society Press, 1996 |
| Descrizione fisica: | 1 online resource (500 pages) : illustrations |
| Disciplina: | 621.395 |
| Soggetto topico: | Integrated circuits - Very large scale integration - Testing |
| Persona (resp. second.): | IEEE Staff |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Sommario/riassunto: | Reports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on-line testing, volume manufacturing, sequential circuits, multi-chip modules and memory testing, non-traditional approaches, fault simulation and test generation, and built-in self-tests. No subject index. Annotation copyright by Book News, Inc., Portland, OR. |
| Titolo autorizzato: | VLSI Test Symposium, 14th IEEE (VTS '96 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996210382003316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |