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100   $a20160829d1996      uy              
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aVLSI Test Symposium, 14th IEEE (VTS '96
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1996
215   $a1 online resource (500 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-7304-4 
330   $aReports on recent concepts, methodologies, and trends in testing electronic circuits and systems to meet the challenges of a wider range of capabilities being integrated into compact products, and the higher quality being demanded. Some 90 papers explore such aspects as designing for testability, on-line testing, volume manufacturing, sequential circuits, multi-chip modules and memory testing, non-traditional approaches, fault simulation and test generation, and built-in self-tests. No subject index. Annotation copyright by Book News, Inc., Portland, OR.
606   $aIntegrated circuits$xVery large scale integration$xTesting
615  0$aIntegrated circuits$xVery large scale integration$xTesting.
676   $a621.395
702   $aIEEE Staff
801  0$bPQKB
906   $aBOOK
912   $a996210382003316
996   $aVLSI Test Symposium, 14th IEEE (VTS '96$92407795
997   $aUNISA