2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
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| Titolo: |
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) / / IEEE Staff
|
| Pubblicazione: | Piscataway, NJ : , : IEEE, , 2013 |
| Descrizione fisica: | 1 online resource |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Very large scale integration |
| Integrated circuits - Fault tolerance | |
| Altri titoli varianti: | 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Defect and Fault Tolerance in VLSI and Nanotechnology Systems | |
| Titolo autorizzato: | 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) |
| ISBN: | 1-4799-1585-8 |
| 1-4799-1584-X | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996279995003316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |