01446nam 2200385 450 99627999500331620231020224144.01-4799-1585-81-4799-1584-X(CKB)3390000000045242(NjHacI)993390000000045242(EXLCZ)99339000000004524220231020d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) /IEEE StaffPiscataway, NJ :IEEE,2013.1 online resource1-4799-1583-1 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology SystemsDefect and Fault Tolerance in VLSI and Nanotechnology Systems Integrated circuitsVery large scale integrationCongressesIntegrated circuitsFault toleranceCongressesIntegrated circuitsVery large scale integrationIntegrated circuitsFault tolerance621.3815NjHacINjHaclPROCEEDING9962799950033162013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)2543610UNISA