Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules : preprint / / Erick Gutierrez [and three others]

• Autore: Gutierrez Erick (Mechanical engineer)
• Pubblicazione: Golden, CO : , : National Renewable Energy Laboratory, , 2020
• Descrizione fisica: 1 online resource (7 pages) : illustrations (chiefly color)
• Soggetto topico: Insulated gate bipolar transistors - United States; Thermal conductivity - United States; Insulated gate bipolar transistors; Thermal conductivity
• Soggetto geografico: United States
• Soggetto genere / forma: Observations.
• Note generali: "February 2020."; "Presented at ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (IPACK2019), Anaheim, California, October 7-9, 2019"--Page 1 of cover.
• Nota di bibliografia: Includes bibliographical references (page 6-7).
• Altri titoli varianti: Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules
• Titolo autorizzato: Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910713883003321
• Lo trovi qui: Univ. Federico II