02179oam 2200517 450 991071388300332120201222074339.0(CKB)5470000002504861(OCoLC)1190659371(EXLCZ)99547000000250486120200824d2020 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierThermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules preprint /Erick Gutierrez [and three others]Golden, CO :National Renewable Energy Laboratory,2020.1 online resource (7 pages) illustrations (chiefly color)Conference paper ;NREL/CP-5400-73583"February 2020.""Presented at ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems (IPACK2019), Anaheim, California, October 7-9, 2019"--Page 1 of cover.Includes bibliographical references (page 6-7).Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules Insulated gate bipolar transistorsUnited StatesObservationsThermal conductivityUnited StatesObservationsInsulated gate bipolar transistorsfastThermal conductivityfastUnited StatesfastObservations.fastInsulated gate bipolar transistorsThermal conductivityInsulated gate bipolar transistors.Thermal conductivity.Gutierrez Erick(Mechanical engineer),1398619National Renewable Energy Laboratory (U.S.),GPOGPOOCLCFGPOOCLCOGPOBOOK9910713883003321Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules3462258UNINA